Dependent temperature control within disk drive testing systems
First Claim
Patent Images
1. A method of controlling a temperature of a test slot in a cluster of test slots, the method comprising:
- receiving a request for a temperature change for the test slot;
comparing (i) a power draw of the cluster expected to result from the temperature change, to (ii) an amount of power available to the cluster; and
performing one or more of first operations and second operations;
wherein the first operations comprise;
determining, based on comparing, that the power draw exceeds the amount of power available; and
inhibiting the temperature change;
wherein the second operations comprise;
determining, based on comparing, that the power draw is less than or equal to the amount of power available to the cluster; and
effectuating the temperature change.
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Abstract
A method of controlling a temperature of a subject test slot in a cluster of test slots includes evaluating a request for a temperature change for the subject test slot to determine if sufficient power is available to achieve the requested temperature change, and inhibiting the requested temperature change unless or until sufficient power is determined to be available to achieve the requested temperature change.
401 Citations
34 Claims
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1. A method of controlling a temperature of a test slot in a cluster of test slots, the method comprising:
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receiving a request for a temperature change for the test slot; comparing (i) a power draw of the cluster expected to result from the temperature change, to (ii) an amount of power available to the cluster; and performing one or more of first operations and second operations; wherein the first operations comprise; determining, based on comparing, that the power draw exceeds the amount of power available; and inhibiting the temperature change; wherein the second operations comprise; determining, based on comparing, that the power draw is less than or equal to the amount of power available to the cluster; and effectuating the temperature change. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A disk drive testing system comprising:
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a cluster of test slots; and test electronics configured for electrical communication with the cluster of test slots and further configured to perform operations comprising; receiving a request for a temperature change for a test slot in the cluster; comparing (i) a power draw of the cluster expected to result from the temperature change, to (ii) an amount of power available to the cluster; and performing one or more of first operations and second operations; wherein the first operations comprise; determining, based on comparing, that the power draw exceeds the amount of power available; and inhibiting the temperature change; wherein the second operations comprise; determining, based on comparing, that the power draw is less than or equal to the amount of power available to the cluster; and effectuating the temperature change. - View Dependent Claims (13, 14, 15)
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16. A method of controlling a temperature of one or more test slots in a cluster of test slots, the method comprising:
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calculating an active power draw of the cluster of test slots; calculating an active cooling liquid power load of the cluster of test slots; and adjusting a flow of power for heating or cooling one or more test slots of the cluster of test slots based, at least in part, on at least one of the active power draw and the active cooling liquid power load. - View Dependent Claims (17, 18, 19)
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20. A disk drive testing system comprising:
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a cluster of test slots; and test electronics configured for electrical communication with the cluster of test slots and further configured to perform operations comprising; calculating an active power draw of the cluster of test slots; calculating an active cooling liquid power load of the cluster of test slots; and adjusting a flow of power for heating or cooling one or more test slots of the cluster of test slots based, at least in part, on at least one of the active power draw and the active cooling liquid power load. - View Dependent Claims (21, 22, 23)
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24. One or more machine-readable media configured to store instructions that are executable by test electronics to perform operations comprising:
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receiving a request for a temperature change for a test slot in a cluster of test slots; comparing (i) a power draw of the cluster expected to result from the temperature change, to (ii) an amount of power available to the cluster; and performing one or more of first operations and second operations; wherein the first operations comprise; determining, based on comparing, that the power draw exceeds the amount of power available; and inhibiting the temperature change; wherein the second operations comprise; determining, based on comparing, that the power draw is less than or equal to the amount of power available to the cluster; and effectuating the temperature change. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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Specification