Semiconductor device and manufacturing method of the same
First Claim
1. A semiconductor device comprising a first conductivity type semiconductor element and a second conductivity type semiconductor element different from each other in conductivity type and aligned with each other,wherein the first conductivity type semiconductor element comprises:
- a first element-added insulating layer placed over a semiconductor substrate, having insulation properties, and containing a first element and a second element different therefrom; and
an element-added conductive layer placed over the first element-added insulating layer, having conductivity, and containing the second element, andwherein the second conductivity type semiconductor element comprises;
a second element-added insulating layer aligned with the first element-added insulating layer over the semiconductor substrate over which the first element-added insulating layer is placed, having insulation properties, and containing the first element;
and an electrode conductive layer placed over the second element-added insulating layer and having conductivity.
1 Assignment
0 Petitions
Accused Products
Abstract
Provided is a highly reliable semiconductor device equipped with a plurality of semiconductor elements having desired properties, respectively; and a manufacturing method facilitating the manufacture of the semiconductor device. The semiconductor device is manufactured by forming a gate-electrode metal film having a thickness of from 3 to 30 nm over the entire upper surface of a gate insulating film; forming an n-side cap layer having a thickness of 10 nm or less over the entire upper surface of a portion of the gate-electrode metal film belonging to an nFET region by using a material different from that of the gate-electrode metal film; and carrying out heat treatment over the n-side cap layer to diffuse the material of the n-side cap layer into the gate-electrode metal film immediately below the n-side cap layer and react them to form an n-side gate-electrode metal film in a nFET region. A poly-Si layer is then deposited, followed by gate electrode processing.
-
Citations
5 Claims
-
1. A semiconductor device comprising a first conductivity type semiconductor element and a second conductivity type semiconductor element different from each other in conductivity type and aligned with each other,
wherein the first conductivity type semiconductor element comprises: -
a first element-added insulating layer placed over a semiconductor substrate, having insulation properties, and containing a first element and a second element different therefrom; and an element-added conductive layer placed over the first element-added insulating layer, having conductivity, and containing the second element, and wherein the second conductivity type semiconductor element comprises; a second element-added insulating layer aligned with the first element-added insulating layer over the semiconductor substrate over which the first element-added insulating layer is placed, having insulation properties, and containing the first element; and an electrode conductive layer placed over the second element-added insulating layer and having conductivity. - View Dependent Claims (2)
-
-
3. A semiconductor device comprising a first conductivity type semiconductor element and a second conductivity type semiconductor element different from each other in conductivity type and aligned with each other,
wherein the first conductivity type semiconductor element comprises: -
a first element-added insulating layer placed over a semiconductor substrate, having insulation properties, and containing a first element and a second element different therefrom; and a first element-added conductive layer placed over the first element-added insulating layer, having conductivity, and containing the second element, and wherein the second conductivity type semiconductor element comprises; a second element-added insulating layer aligned with the first element-added insulating layer over the semiconductor substrate over which the first element-added insulating layer is placed, having insulation properties, and containing the first element; an electrode conductive layer placed over the second element-added insulating layer and having conductivity, a second element-added conductive layer placed over the electrode conductive layer, having conductivity, and containing the second element; and another second element-added conductive layer placed over the second element-added conductive layer, having conductivity, and containing the second element.
-
-
4. A semiconductor device comprising a first conductivity type semiconductor element and a second conductivity type semiconductor element different from each other in conductivity type and aligned with each other,
wherein the first conductivity type semiconductor element comprises: -
a first element-added insulating layer placed over a semiconductor substrate, having insulation properties, and containing a first element and a second element different therefrom; and a first element-added conductive layer placed over the first element-added insulating layer, having conductivity, and containing the second element; and wherein the second conductivity type semiconductor element comprises; a second element-added insulating layer aligned with the first element-added insulating layer over the semiconductor substrate over which the first element-added insulating layer is placed, having insulation properties, and containing the first element; an electrode conductive layer placed over the second element-added insulating layer and having conductivity; and a second element-added conductive layer placed over the electrode conductive layer, having conductivity, and containing the second element.
-
-
5. A semiconductor device comprising a first conductivity type semiconductor element and a second conductivity type semiconductor element different from each other in conductivity type and aligned with each other,
wherein the first conductivity type semiconductor element comprises: -
a first element-added insulating layer placed over a semiconductor substrate, having insulation properties, and containing a first element and a second element different therefrom; and a first element-added conductive layer placed over the first element-added insulating layer, having conductivity, and containing the second element; and wherein the second conductivity type semiconductor element comprises; a second element-added insulating layer aligned with the first element-added insulating layer over the semiconductor substrate over which the first element-added insulating layer is placed, having insulation properties, and containing the first element; an electrode conductive layer placed over the second element-added insulating layer and having conductivity; and an upper conductive layer placed over the electrode conductive layer, having conductivity, and containing a material different from the material of the electrode conductive layer.
-
Specification