Systems and methods for improved coordination acquisition member comprising calibration information

• US 8,122,610 B2
• Filed: 03/28/2008
• Issued: 02/28/2012
• Est. Priority Date: 03/28/2008
• Status: Active Grant

• Current Assignee: Hexagon Metrology Incorporated (Hexagon AB)
• Original Assignee: Hexagon Metrology Incorporated (Hexagon AB)
• Inventors: Tait, Hogar, Frohlich, Brian
• Primary Examiner(s): GUADALUPE, YARITZA
• Application Number:
  US12/057,918
• Publication Number:
  US 20090241360A1
• Time in Patent Office: 1,432 Days
• Field of Search: 33502-504, 335/49, 335/55, 335/56
• US Class Current: 33/502
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence

Abstract

Apparatus, systems and methods for an improved probe for a coordinate measurement machine (PCMM) is disclosed herein. The probe comprises a machine readable unique serial number, which the PCMM can read from the probe to identify the probe and obtain information relating to calibration of the probe by matching the unique serial number with unique serial number stored with the information relating calibration. The coordinate information device further comprises modules configured to store and provide the machine readable unique serial number, and also information relating to calibrating the probe.

Claims

1. A probe for a coordinate measurement machine comprising:

a probe tip;

at least one device comprising non-modifiable information relating to calibrating the probe with the coordinate measurement machine and configured to provide said information relating to calibrating the probe with the coordinate measurement machine; and

a probe mount configured to mount the probe tip and the at least one device to the coordinate measurement machine,

wherein the probe tip, probe mount, and at least one device form a singular unit configured to mount to a coordinate measurement machine.

2. The probe of claim 1, wherein the at least one device comprises a solid-state memory device configured to store data.

3. The probe of claim 2, wherein the solid-state memory device comprises a non-volatile electrically erasable programmable read-only memory (EEPROM) device.

4. The probe of claim 2, wherein the solid-state memory device is further configured to provide a machine readable serial number configured to uniquely identify the probe.

5. The probe of claim 2, wherein the solid-state memory device is further configured to store nominal data relating to the characteristics of the probe.

6. The probe of claim 2, wherein the solid-state memory device is further comprises a presence detection sensor.

7. The probe of claim 1, wherein the at least one device comprises a temperature sensor configured to provide the temperature of the probe.

8. The probe of claim 1, wherein the at least one device comprises a presence detection sensor configured to indicate that the probe is mounted onto a coordinate measurement machine.

9. The probe of claim 1, wherein the at least one device comprises a processor configured to control the operations of the solid-state memory device, the temperature sensor, or the presence detection sensor.

10. The probe of claim 1, wherein the probe tip comprises at least one device configured to provide temperature of the probe or information relating to calibrating the probe with the coordinate measurement machine.

11. The probe of claim 1, wherein the probe is configured to communicate wirelessly with the coordinate measurement machine.

12. The probe of claim 11, where said wireless communication is over a communications protocol selected from the group of Bluetooth, WiFi, and radio frequency.

13. The probe of claim 1, wherein the at least one device configured to provide information is configured to provide information over a two wire data communications protocol.

14. The probe of claim 13, wherein the two wire data communications protocol also provides power.

15. The probe of claim 13, wherein the two wire data communications protocol comprises only a power wire and a ground wire.

16. The probe of claim 1, wherein the non-modifiable information comprises a laser etched serial number.

17. A spatial coordinate measurement system comprising:

a coordinate measurement machine;

a singular probe that is removably attached to the coordinate measurement machine to form an end of the coordinate measurement machine; and

wherein the singular probe comprises at least one device comprising non-modifiable information relating to calibrating the probe with the coordinate measurement machine and configured to provide said information relating to calibrating the probe with the coordinate measurement machine.

18. The spatial coordinate measurement system of claim 17, wherein the coordinate measurement machine calibrates the probe based at least in part on the information provided by the at least one device configured to provide information relating to calibrating the acquisition device with the coordinate measurement machine.

19. The spatial coordinate measurement system of claim 18, wherein the probe comprises a temperature sensor configured to provide the temperature of the probe.

20. The spatial coordinate measurement system of claim 18, wherein the probe comprises a presence detection sensor configured to indicate that the probe is mounted onto a coordinate measurement machine.

21. The spatial coordinate measurement system of claim 17, wherein the coordinate measurement machine comprises a solid-state memory device configured to provide data.

22. The spatial coordinate measurement system of claim 21, wherein the solid-state memory device is configured to provide a machine readable serial number uniquely identifying the probe.

23. The spatial coordinate measurement system of claim 21, wherein the solid-state memory device comprises a non-volatile electrically erasable programmable read-only memory (EEPROM) device.

24. The spatial coordinate measurement system of claim 21, wherein the solid-state memory device is further configured to provide nominal data relating to the physical parameters of the probe.

25. The spatial coordinate measurement system of claim 17, wherein the coordinate measurement machine comprises an articulated arm.

26. The spatial coordinate measurement system of claim 17, wherein the device configured to provide information is configured to provide information over a two wire data communications protocol.

27. The spatial coordinate measurement system of claim 26, wherein the two wire data communications protocol also provides power.

28. The spatial coordinate system of claim 27, wherein the two wire data communications protocol comprises only a power wire and a ground wire.

29. The spatial coordinate measurement system of claim 17, wherein the non-modifiable information comprises a laser etched serial number.

30. A method for calibrating a coordinate measurement machine comprising:

attaching a singular probe to the coordinate measurement machine to form an end of the coordinate measurement machine;

detecting the singular probe attached to the end of the coordinate measurement machine;

acquiring non-modifiable calibration information related to the singular probe from the singular probe at the end of the coordinate measurement machine; and

calibrating the singular probe to the coordinate measurement machine using at least part of the acquired non-modifiable calibration information.

31. The method of claim 30, wherein detecting the probe further comprises providing a presence detection sensor to indicate that probe is mounted onto the coordinate measurement machine.

32. The method of claim 30, wherein acquiring calibration information related to the probe further comprises providing a solid-state memory device configured to provide calibration information.

33. The method of claim 30, wherein acquiring calibration information related to the probe further comprises acquiring a machine readable serial number uniquely identifying the probe.

34. The method of claim 30, wherein acquiring calibration information related the probe further comprises acquiring nominal data relating to the physical characteristics of the coordinate the probe.

35. The method of claim 34, wherein acquiring calibration information related the probe further comprises acquiring nominal data relating to the physical characteristics of the coordinate the probe using a machine readable serial number uniquely identifying the probe.

36. The method of claim 30, wherein acquiring calibration information related the probe further comprises acquiring temperature of the probe.

37. The method of claim 30, wherein calibrating the probe to the coordinate measurement machine further comprises providing translation from the end of the probe to the tip of the probe.

38. The method of claim 30, further comprising the step of transmitting information from the probe to the coordinate measurement machine over a two wire data communications protocol.

39. The method of claim 38, wherein the two wire data communications protocol also provides power.

40. The method of claim 39, wherein the two wire communications protocol comprises only a power wire and a ground wire.

41. The method of claim 30, wherein the non-modifiable calibration information comprises a laser etched serial number.