Apparatus, system and method for testing electronic elements

• US 8,130,006 B2
• Filed: 01/12/2010
• Issued: 03/06/2012
• Est. Priority Date: 03/25/2005
• Status: Active Grant

• Current Assignee: Vishay General Semiconductor LLC (Vishay Intertechnology Incorporated)
• Original Assignee: Vishay General Semiconductor LLC (Vishay Intertechnology Incorporated)
• Inventors: Li, Kuang-Jung, Hsu, Chin-Chen, Lin, Yi-Li, Wu, Shyan-I
• Primary Examiner(s): Phan, Huy Q
• Assistant Examiner(s): CHAN, EMILY Y
• Application Number:
  US12/685,745
• Publication Number:
  US 20100109692A1
• Time in Patent Office: 784 Days
• Field of Search: 32475401-76505
• US Class Current: 324/755.01
• CPC Class Codes: G01R 31/2889 Interfaces, e.g. between probe and tester G01R31/31905 and G01R1/07364 take precedence

Abstract

An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

Claims

1. An electronic element testing apparatus for use with a number of probes, each probe having a lower pole and an upper pole, the apparatus comprising:

a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and

a plurality of stationary signal conductor regions disposed proximate the array of lower pole regions, each stationary signal conductor region comprising metal-coated through holes through a motherboard mounted on the second side of said first plate, and arranged to provide a stationary non-cable electrical path between a lower pole region and a switching circuit,

wherein when lower poles are disposed at least some of the lower pole regions, when each lower pole contacts a first terminal region of an electronic element, when an upper pole complementary to each lower pole contacts a second terminal region of the electronic element, and when each signal conductor region provides a non-cable electrical path between a lower pole region and a switching circuit, the switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

2. The apparatus according to claim 1, wherein the number of probes comprises at least about fifty.

3. The apparatus according to claim 1, wherein the lower pole regions comprise openings in the first plate.

4. The apparatus according to claim 1, wherein the upper and lower poles comprise copper.

5. The apparatus according to claim 4, wherein each upper pole is adapted to pick-up an electronic element and place the electronic element proximate a lower pole.

6. An electronic element testing apparatus for use with a number of probes, each probe having a lower pole and an upper pole, apparatus comprising:

a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and

a plurality of stationary signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a stationary non-cable electrical path between a lower pole region and a switching circuit,

wherein when lower poles are disposed at least some of the lower pole regions, when each lower pole contacts a first terminal region of an electronic element, when an upper pole complementary to each lower pole contacts a second terminal region of the electronic element, and when each signal conductor region provides a non-cable electrical path between a lower pole region and a switching circuit, the switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles, and

wherein the upper poles are secured to an upper probe plate, substantially parallel to the first plate, one of the first plate and the upper probe plate movable with respect to the other to bring the upper poles and the lower poles in electrical contact with an electronic element disposed therebetween.