Temperature compensation via power supply modification to produce a temperature-independent delay in an integrated circuit

• US 8,130,024 B2
• Filed: 04/15/2011
• Issued: 03/06/2012
• Est. Priority Date: 02/08/2006
• Status: Active Grant

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Zimlich, David
• Primary Examiner(s): Donovan, Lincoln
• Assistant Examiner(s): HOUSTON, ADAM D
• Application Number:
  US13/087,654
• Publication Number:
  US 20110187441A1
• Time in Patent Office: 326 Days
• Field of Search: 327/512, 327/513, 327538-543
• US Class Current: 327/512
• CPC Class Codes: H03L 1/022 by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature H03L1/021 takes precedence
• CPC Class Codes: H03L 7/0814 the phase shifting device being digitally controlled

Abstract

A method and circuitry for adjusting the delay of a variable delay line (VDL) in a delay locked loop (DLL) or other delay element or subcircuit on an integrated circuit is disclosed. Such delay circuitry will inherently have a delay which is a function of temperature. In accordance with embodiments of the invention, such temperature-dependent delays are compensated for by adjusting the power supply voltage of the VDL, delay element, or subcircuit. Specifically, a temperature sensing stage is used to sense the temperature of the integrated circuit, and hence the VDL, delay element, or subcircuit. Information concerning the sensed temperature is sent to a regulator which derives the local power supply voltage from the master power supply voltage, Vcc, of the integrated circuit. If the temperature sensed is relatively high, which otherwise would increase the delay though the VDL, delay element, or subcircuit, the regulator increases the local power supply voltage, thus decreasing the delay and offsetting the increase in delay due to temperature. Through this scheme, and assuming the temperature sensing stage is properly tuned, temperature-dependent delays can be reduced to approximately zero.

Claims

1. A temperature sensor for an integrated circuit, comprising:

at least one temperature sensitive element for producing a first analog voltage indicative of a sensed temperature;

a temperature quantizer for receiving at least the first analog voltage and for producing a plurality of digital signals indicative of one of a plurality of temperature ranges corresponding to the sensed temperature;

a regulator for receiving the plurality of digital signals and for producing a second quantized analog voltage indicative of one of the temperature ranges in accordance with the digital signals; and

a circuit block, wherein the second quantized analog voltage comprises a power supply voltage for the circuit block.

2. The temperature sensor of claim 1, wherein the temperature sensitive element comprises a P-N junction.

3. The temperature sensor of claim 1, wherein the temperature quantizer further comprises a plurality of comparators, wherein the output of each of the comparators comprises one of the plurality of digital signals.

4. The temperature sensor of claim 3, wherein the comparators each receive at a first input a voltage indicative of the first analog voltage.

5. The temperature sensor of claim 4, wherein the comparators each receive a temperature-insensitive voltage at a second input.

6. The temperature sensor of claim 1, wherein the digital signals are used to control a load resistance of the regulator.

7. The temperature sensor of claim 6, wherein the digital signals are used to include or disclude resistors in the load resistance.

8. The temperature sensor of claim 6, wherein the regulator comprises a transistor, and wherein the second quantized analog voltage intervenes between the transistor and the load resistance.

9. The temperature sensor of claim 8, wherein the transistor and the load resistance comprise a voltage divider formed between a power supply and ground.

10. The temperature sensor of claim 8, wherein the transistor is gated by an operational amplifier.

11. The temperature sensor of claim 10, wherein the operational amplifier receives a temperature insensitive voltage a first input, and a feedback voltage from the load resistance at a second input.

12. A temperature sensor for an integrated circuit, comprising:

a temperature sensor for producing a plurality of signals indicative of sensed temperature range; and

a regulator for receiving the plurality of signals and for producing a quantized analog voltage indicative of the sensed temperature range; and

a circuit block, wherein the quantized analog voltage comprises a power supply voltage for the circuit block.

13. The integrated circuit of claim 12, wherein the plurality of signals comprise a plurality of digital signals.

14. The temperature sensor of claim 12, wherein the temperature sensor comprises a P-N junction.

15. The temperature sensor of claim 12, wherein the temperature sensor further comprises a plurality of comparators, wherein the output of each of the comparators comprises one of the plurality of signals.

16. The temperature sensor of claim 15, wherein the comparators each receive a temperature sensitive voltage at a first input.

17. The temperature sensor of claim 16, wherein the comparators each receive a temperature-insensitive voltage at a second input.

18. The temperature sensor of claim 12, wherein the signals are used to control a load resistance of the regulator.

19. The temperature sensor of claim 18, wherein the regulator comprises a transistor, and wherein the quantized analog voltage intervenes between the transistor and the load resistance.

20. The temperature sensor of claim 19, wherein the transistor and the load resistance comprise a voltage divider formed between a power supply and ground.

21. The temperature sensor of claim 19, wherein the transistor is gated by an operational amplifier.

22. The temperature sensor of claim 21, wherein the operational amplifier receives a temperature insensitive voltage a first input, and a feedback voltage from the load resistance at a second input.