Long data record analysis

• US 8,131,489 B2
• Filed: 10/27/2006
• Issued: 03/06/2012
• Est. Priority Date: 10/27/2006
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Heuser, Patricia A., Robinson, Tristan A.
• Primary Examiner(s): Nghiem, Michael
• Assistant Examiner(s): Desta, Elias
• Application Number:
  US11/588,809
• Publication Number:
  US 20080147342A1
• Time in Patent Office: 1,957 Days
• Field of Search: 386/13, 386/21, 702/67, 702/71, 702/79, 702/176, 702/179, 702/187, 702/189, 714/100
• US Class Current: 702/67
• CPC Class Codes: G01R 13/02 for displaying measured electric variables in digital form
• CPC Class Codes: G01R 13/029 Software therefor

Abstract

A data analysis technique for a long data record in a memory uses a reference, either user-provided or calculated from the data in the long data record, as a representative event. Each event in the long data record is compared with the reference to determine whether there are significant deviations from the reference. Those events having significant deviations are identified as events of particular interest for a user. The reference may be either a waveform shape or a mean time interval between events. A tolerance value may be added to the waveform reference and varied for dynamic limit testing. Events that are outside the waveform reference as modified by the tolerance value are identified as outliers and may be reduced to iconic images for display simultaneously with the long data record and a selected one of the outliers.

Claims

1. A method of data analysis in a test and measurement instrument comprises:

inputting a long data record into a memory of the test and measurement instrument which contains repetitive data over a period of time, each instance of the repetitive data forming a data frame, wherein the method further comprising the steps of;

specifying, by the measurement instrument a reference frame having a tolerance value for the long data record;

comparing, by the measurement instrument each data frame with the reference frame to identify outlier frames that have significant deviations from the reference frame as determined by the tolerance value; and

displaying a selected one of the outlier frames in a graticule view on the test and measurement instrument display.

2. The method as recited in claim 1 further comprising the step of displaying a “

bird'"'"'s eye”

view of the long data record together with the graticule view.

3. The method as recited in claim 1 wherein the displaying step comprises the step of displaying a plurality of postage stamps in a user interface view, one for each of the outlier frames.

4. The method as recited in claim 1 wherein the specifying step comprises the step of storing a user-provided reference frame as the reference frame.

5. The method as recited in claim 4 wherein the user-provided reference frame comprises a reference frame selected from a group consisting of a waveform shape, a mean interval between data frames and a defined data packet.

6. The method as recited in claim 1 wherein the specifying step comprises a step of calculating the reference frame as an average of the data frames within the long data record.

7. The method as recited in claim 6 wherein the reference frame comprises an average waveform shape.

8. The method as recited in claim 7 wherein the average waveform shape comprises an average of all of the data frames excluding the outlier frames.

9. The method as recited in claim 7 further comprising the step of varying the tolerance value for the reference frame to vary the number of outlier frames.

10. The method as recited in claim 2 further comprising the step of providing a cursor in the “

bird'"'"'s eye”

view to indicate a location within the long data length record of the outlier frame being displayed in the graticule view.

11. The method as recited in claim 10 further comprising the step of highlighting in the “

bird'"'"'s eye”

view the outlier frames.

12. The method as recited in claim 7 further comprising the steps of:

generating icons for the outlier frames, each icon representing a waveform shape for its associated outlier frame; and

displaying the icons in a user interface view.

13. The method as recited in claim 12 further comprising the step of selecting one of the icons from the user interface view for displaying the associated outlier frame in the graticule view.

14. The method as recited in claim 13 further comprising the step of highlighting the icon for the outlier frame represented in the graticule view.

15. The method as recited in claim 4 wherein the user-provided reference frame comprises a mean interval between data frames as the reference frame.

16. The method as recited in claim 1 wherein the specifying step comprises a step of calculating from the data frames within the long data record a mean time interval between the data frames as the reference frame.

17. The method as recited in claim 2 wherein the displaying step comprises the step of displaying a plurality of postage stamps in a user interface view, one postage stamp for each of the outlier frames.