Method for forming metal film by ALD using beta-diketone metal complex
First Claim
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1. A method of forming a single-metal film on a substrate by plasma atomic layer deposition (ALD), comprising:
- (i) contacting a surface of a substrate with a β
-diketone metal complex in a gas phase whereby molecules of the β
-diketone metal complex are attached to the surface of the substrate;
(ii) exposing the molecule-attached surface only to a nitrogen-hydrogen mixed plasma, thereby forming an atomic layer of the metal; and
(iii) repeating steps (i) and (ii) for a next atomic layer on top of the atomic layer in step (ii), thereby accumulating the atomic layers to form the single-metal film which is a virtually pure metal layer having a purity of at least 99% on the substrate,wherein the nitrogen-hydrogen mixed plasma is produced by supplying a gas containing nitrogen and hydrogen, followed by applying RF power of 200 to 500 W having a frequency of 13.56 MHz to the gas,wherein the gas containing nitrogen and hydrogen is a mixture of nitrogen gas and hydrogen gas wherein a volumetric ratio of nitrogen gas to hydrogen gas is 5/100 to 50/100.
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Abstract
A method of forming a single-metal film on a substrate by plasma ALD includes: contacting a surface of a substrate with a β-diketone metal complex in a gas phase; exposing molecule-attached surface to a nitrogen-hydrogen mixed plasma; and repeating the above steps, thereby accumulating atomic layers to form a single-metal film on the substrate.
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16 Claims
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1. A method of forming a single-metal film on a substrate by plasma atomic layer deposition (ALD), comprising:
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(i) contacting a surface of a substrate with a β
-diketone metal complex in a gas phase whereby molecules of the β
-diketone metal complex are attached to the surface of the substrate;(ii) exposing the molecule-attached surface only to a nitrogen-hydrogen mixed plasma, thereby forming an atomic layer of the metal; and (iii) repeating steps (i) and (ii) for a next atomic layer on top of the atomic layer in step (ii), thereby accumulating the atomic layers to form the single-metal film which is a virtually pure metal layer having a purity of at least 99% on the substrate, wherein the nitrogen-hydrogen mixed plasma is produced by supplying a gas containing nitrogen and hydrogen, followed by applying RF power of 200 to 500 W having a frequency of 13.56 MHz to the gas, wherein the gas containing nitrogen and hydrogen is a mixture of nitrogen gas and hydrogen gas wherein a volumetric ratio of nitrogen gas to hydrogen gas is 5/100 to 50/100. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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