Multi-modal particle detector

• US 8,134,122 B2
• Filed: 01/19/2010
• Issued: 03/13/2012
• Est. Priority Date: 03/20/2008
• Status: Active Grant

• Current Assignee: Mitre Corporation
• Original Assignee: Mitre Corporation
• Inventors: Guharay, Samar K.
• Primary Examiner(s): Sakelaris, Sally
• Application Number:
  US12/689,825
• Publication Number:
  US 20120032071A1
• Time in Patent Office: 784 Days
• Field of Search: 422/68.1, 422/100
• US Class Current: 250/287
• CPC Class Codes: G01N 21/658 enhancement Raman, e.g. surface plasmons
• CPC Class Codes: G01N 27/622 Ion mobility spectrometry
• CPC Class Codes: Y10T 436/173076 Nitrite or nitrate

Abstract

Systems, methods and computer program products for the multi-modal detection of particles are described herein. An embodiment of the present invention is a particle detector that includes a first chamber wherein analyte particles are subjected to a first particle detection mechanism, and a second chamber coupled to the first chamber, wherein the analyte particles are subjected to a second particle detection mechanism, and wherein the detection characteristics of second particle detection mechanism are orthogonal to detection characteristics of the first particle detection mechanism. According to another embodiment, the present invention is a particle detection method including the steps of detecting presence of at least one predetermined particle type in an analyte particle sample using a first particle detection mechanism, and confirming the presence of the predetermined particle type in the analyte particle sample using a second particle detection mechanism, wherein detection characteristics of the second particle detection mechanism are orthogonal to detection characteristics of the first detection mechanism.

Claims

1. A particle detection method, comprising:

(a) detecting a subset of particles of at least one predetermined particle type in an analyte particle sample using a first particle detection mechanism in a first chamber of a particle detector; and

(b) controlling a shutter between an exit of the first chamber and an entrance of a second chamber of the particle detector, wherein a control module is configured to perform the controlling by opening the shutter in response to said detecting to selectively input only particles of the subset to the second chamber; and

(c) confirming the presence of the predetermined particle type by using a second particle detection mechanism in the second chamber to analyze only the particles of the subset which are input to the second chamber through said controlled shutter, wherein detection characteristics of the second particle detection mechanism are orthogonal to detection characteristics of the first detection mechanism, and wherein the second particle detection mechanism is activated in response to the detection.

2. The particle detection method of claim 1, wherein the first particle detection mechanism is Ion Mobility Spectroscopy (IMS).

3. The particle detection method of claim 1, wherein the detecting step (Step 1(a)) comprises:

(i) ionizing the analyte particle sample in the first chamber; and

(ii) flowing the ionized analyte particle sample through the first chamber.

4. The particle detection method of claim 3, wherein the detecting step (Step 1(a)) further comprises:

(iv) configuring an electric field in the first chamber to assist flowing of the ionized analyte particle sample.

5. The particle detection method of claim 3, wherein the inputting comprises:

configuring a shutter grid to permit the ionized analyte particle sample into the first chamber.

6. The particle detection method of claim 1, wherein the second particle detection mechanism is Surface Enhanced Raman Spectroscopy (SERS).

7. The particle detection method of claim 6, wherein the confirming comprises:

(i) flowing a plurality of ionized particles from the particles of the at least one predetermined particle type into the second chamber;

(ii) depositing the plurality of ionized particles from the particles of the at least one predetermined particle type on a SERS substrate;

(iii) irradiating a the SERS substrate with a light source; and

(iv) detecting Raman signals corresponding to the plurality of ionized particles.

8. The method of claim 1, wherein the controlling further includes closing the shutter upon completion of the detecting of the presence of particles of the at least one predetermined particle type.

9. The method of claim 1, wherein the detecting includes:

(i) preconfiguring mobility characteristics of the at least one predetermined particle type in the particle detector;

(ii) determining mobility characteristics of particles of the analyte sample using the first particle detection mechanism; and

(iii) finding a match between the determined mobility characteristics and the preconfigured mobility characteristics.

10. The method of claim 9, wherein the controlling further includes:

(i) determining a time interval in which to open the shutter, wherein the time interval is based on the matched preconfigured mobility characteristics; and

(ii) opening the shutter based on the determined time interval.

11. The method of claim 10, wherein opening the shutter includes:

electronically opening the shutter based on the determined time interval.

12. The method of claim 7, wherein the confirming further comprises:

(iv) activating a beam focusing upon the detecting to receive the plurality of ionized particles from the particles of the at least one predetermined particle type into the second chamber.