Enhanced wireless eddy current probe for a non-destructive inspection system

• US 8,138,755 B2
• Filed: 07/10/2009
• Issued: 03/20/2012
• Est. Priority Date: 04/18/2008
• Status: Active Grant

• Current Assignee: Olympus Ndt
• Original Assignee: Olympus Ndt
• Inventors: Drummy, Michael
• Primary Examiner(s): Hollington, Jermele M
• Assistant Examiner(s): NGUYEN, TRUNG Q
• Application Number:
  US12/500,767
• Publication Number:
  US 20090273342A1
• Time in Patent Office: 984 Days
• Field of Search: None
• US Class Current: 324/240
• CPC Class Codes: G01N 27/90 using eddy currents

Abstract

An enhanced wireless eddy current probe is disclosed which has means to wirelessly couple to a non-destructive inspection (NDI) system situated some distance away from an inspection point on a material under inspection. The disclosed enhanced wireless eddy current probe provides means for executing advanced functions necessary for a complex eddy current inspection operation. These functions include, but are not limited to, storing, loading, and executing a predetermined firing sequence on an array of coil elements, probe balancing, probe calibration, and providing bibliographic information specific to said probe to a wirelessly coupled NDI system.

Claims

1. An eddy current, nondestructive inspection system to inspect a test object, comprising:

a probe unit including a probe transceiver and located in a position to carry out tests of the test object;

an NDI unit including an NDI transceiver and configured to operate the probe unit according to predetermined controlling commands including at least one excitation command via a remote communication path established between the probe transceiver and the NDI transceiver;

the probe unit further comprising;

at least one transducer element operable for inducing an eddy current in the test object according to the excitation command;

a receiver circuit for receiving a signal from the test object in response to the eddy current; and

a microcontroller for executing the controlling command and for transferring data from and to the NDI unit via the probe transceiver; and

,

the NDI unit further comprising;

a signal processor configured to process the signal received from the probe unit; and

a user interface.

2. The eddy current, nondestructive inspection system according to claim 1, wherein the probe unit further comprises a nonvolatile memory configured to store information enabling inspection operation of the probe unit.

3. The eddy current, nondestructive inspection system according to claim 1, wherein the at least one transducer element comprises a plurality of transducer elements.

4. The eddy current, nondestructive inspection system according to claim 3, wherein a first one of the plurality of transducer elements is a generator coil electrically connected to an excitation circuit, and a second one of the plurality of transducer elements is a sense coil electrically connected to the receiver circuit.

5. The eddy current, nondestructive inspection system according to claim 3, further comprising a multiplex circuit connecting the plurality of transducer elements to an excitation circuit and to the receiver circuit, the multiplex circuit configured to selectively excite or receive a signal from any of the transducer elements according to the control command.

6. The eddy current, nondestructive inspection system according to claim 3, wherein the plurality of transducer elements are arranged in an array.

7. The eddy current, nondestructive inspection system according to claim 3, further comprising a balancing facility configured to balance each of the transducer element prior to an inspection operation.

8. The eddy current, nondestructive inspection system according to claim 3, further comprising a calibration facility configured to calibrate each of the transducer element prior to an inspection operation.

9. The eddy current, nondestructive inspection system according to claim 1, wherein the probe unit comprises a status indicator for indicating a status of the probe unit.

10. The eddy current, nondestructive inspection system according to claim 9, wherein the status indicator is visible from an exterior of the probe unit.

11. The eddy current, nondestructive inspection system according to claim 1, wherein the NDI unit comprises one or more of a display, a user interface comprising a keypad, and at least one I/O data port.

26. The eddy current, nondestructive inspection system according to claim 1, wherein the probe unit is configured to read information from a machine-readable tag associated with the test object.

27. The eddy current, nondestructive inspection system according to claim 26, wherein the machine-readable tag comprises one or more of an RFID circuit, a bar code in one or more dimensions, and human-readable information.

28. The eddy current, nondestructive inspection system according to claim 1, wherein the probe unit further comprises a circuit operative to receive, decode and record positioning information relevant to signals of a Global Navigation Satellite System.

29. The eddy current, nondestructive inspection system according to claim 28, wherein the probe unit further comprises a circuit operative to report the positioning information to the NDI unit.

12. An eddy current nondestructive inspection probe comprising:

at least one transducer element operable for inducing an eddy current in a test object according to at least one firing sequence command;

a receiver circuit for measuring a signal from the test object in response to the eddy current;

a probe transceiver configured for conducting communications remotely

with an NDI unit;

wherein the NDI unit including an NDI transceiver, and a microcontroller for executing predetermined controlling commands from and sending the signal to the NDI unit via the probe transceiver and the NDI transceiver, wherein the controlling commands including the at least one firing sequence command for excitation of the eddy current.

13. The eddy current nondestructive inspection probe according to claim 12, wherein the probe unit further comprises a nonvolatile memory configured to store information enabling inspection operation of the probe unit.

14. An eddy current nondestructive inspection probe comprising:

at least one transducer element operable for inducing an eddy current in a test object

a receiver circuit for measuring a signal from the test object;

a probe transceiver configured for conducting communications remotely with an NDI unit; and

a microcontroller for executing predetermined controlling commands from and sending the signal to the NDI unit via the probe transceiver wherein the controlling commands including at least a firing sequence command for excitation of the eddy current,

wherein the at least one transducer element comprises a plurality of transducer elements.

15. The eddy current nondestructive inspection probe according to claim 14, wherein a first one of the plurality of transducer elements is a generator coil electrically connected to an excitation circuit, and a second one of the plurality of transducer elements is a sense coil electrically connected to the receiver circuit.

16. The eddy current nondestructive inspection probe according to claim 14, further comprising a multiplex circuit connecting the plurality of transducer elements to an excitation circuit and to the receiver circuit, the multiplex circuit configured to selectively excite or receive a signal from any of the transducer elements.

17. The eddy current nondestructive inspection probe according to claim 14, wherein the plurality of transducer elements are arranged in an array.

18. The eddy current nondestructive inspection probe according to claim 14, further comprising a balancing facility configured to balance each of the transducer elements prior to an inspection operation.

19. The eddy current, nondestructive inspection probe according to claim 14, further comprising a calibration facility configured to calibrate each of the transducer element prior to an inspection operation.

20. An eddy current nondestructive inspection probe comprising:

at least one transducer element operable for inducing an eddy current in a test object;

a receiver circuit for measuring a signal from the test object

a probe transceiver configured for conducting communications remotely with an NDI unit; and

a microcontroller for executing predetermined controlling commands from and sending the signal to the NDI unit via the probe transceiver, wherein the controlling commands including at least a firing sequence command for excitation of the eddy current,

wherein the probe further comprises a status indicator for indicating a status of the probe unit.

21. An eddy current, nondestructive inspection system to inspect a test object, comprising:

a probe unit including a probe transceiver and located in a position to carry out tests of the test object

an NDI unit including an NDI transceiver and configured to operate the probe unit according to predetermined controlling commands including at least one excitation command via a remote communication path established between the probe transceiver and the NDI transceiver;

the probe unit further comprising;

at least one transducer element operable for inducing an eddy current in the test object according to the excitation command;

a receiver circuit for receiving a signal from the test object in response to the eddy current; and

a microcontroller for executing the controlling command and for transferring data from and to the NDI unit via the probe transceiver; and

,

the NDI unit further comprising;

a signal processor configured to process the signal received from the probe unit and

a user interface

further comprising a monitoring station, configured for communication with one or more of the probe unit and the NDI unit.

22. The eddy current, nondestructive inspection system according to claim 21, wherein the monitoring station comprises a memory for storing information received in communication with one or more of the probe unit and the NDI unit.

23. The eddy current, nondestructive inspection system according to claim 21, wherein the monitoring system is configured for wireless communication with one or more of the probe unit and the NDI unit.

24. The eddy current, nondestructive inspection system according to claim 21, wherein the monitoring system is configured to transmit messages to one or more of the probe unit and the NDI unit in response to predetermined criteria.

25. The eddy current, nondestructive inspection system according to claim 21, wherein the monitoring system is configured for communication with plural ones of the NDI unit and the probe unit.