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Apparatus for high density low cost automatic test applications

  • US 8,138,778 B1
  • Filed: 03/30/2006
  • Issued: 03/20/2012
  • Est. Priority Date: 03/31/2005
  • Status: Active Grant
First Claim
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1. A chassis tester comprising:

  • a housing which containsan internal computing system,alternating current (AC) power supplies,a test interface configured to connect a Device Under Test (DUT),slots to house a multiplicity of test boards,a backplane configured to connect all boards,a bridge device configured to connect a computer to the backplane,electrical test modules configured to test the Device Under Test (DUT), andan interposer configured to connect test boards to the Device Under Test (DUT);

    wherein a distributed Radio Frequency (RF) stimulus is distributed to the Device Under Test (DUT);

    the distributed Radio Frequency (RF) stimulus comprises at least Radio Frequency (RF) signal sources and a signal splitter to replicate, convey and distribute multiple copies of the distributed Radio Frequency (RF) stimulus to one or more Devices Under Test (DUT).

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