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Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy

  • US 8,139,846 B2
  • Filed: 11/05/2008
  • Issued: 03/20/2012
  • Est. Priority Date: 11/05/2007
  • Status: Active Grant
First Claim
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1. A system for verifying the integrity of integrated circuits (ICs) procured from an un-trusted source, comprising:

  • an x-ray imaging device; and

    a processing system configured to;

    cause said x-ray imaging device to generate one or more base images of an un-trusted IC;

    produce at least one un-trusted image using said one or more base images, said at least one un-trusted image comprising a plurality of connected components from said un-trusted IC;

    compare said at least one un-trusted image with at least one reference image comprising a plurality of connected elements from a trusted source; and

    identify one or more differences in said connected elementsbetween said un-trusted image and said reference image.

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