On die thermal sensor
First Claim
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1. An on die thermal sensor (ODTS) for use in a semiconductor device, comprising:
- a temperature information output unit for measuring an internal temperature of the semiconductor device to generate a temperature information code having temperature information, and updating the temperature information code in response to an external update signal based on a refresh period, wherein the temperature information output unit includes;
an external update signal output unit for outputting the external update signal in response to a refresh command signal in a normal mode and outputting the external update signal in response to a self-refresh oscillation signal in a self-refresh mode, wherein the external update signal output unit includes a logic gate for performing an OR operation on the refresh command signal and the self-refresh oscillation signal and the external update signal is produced in response to an output of the logic gate.
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Abstract
An on die thermal sensor (ODTS) for use in a semiconductor device includes a temperature information output unit for measuring an internal temperature of the semiconductor device to generate a temperature information code having temperature information, and updating the temperature information code according to a refresh period.
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Citations
52 Claims
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1. An on die thermal sensor (ODTS) for use in a semiconductor device, comprising:
a temperature information output unit for measuring an internal temperature of the semiconductor device to generate a temperature information code having temperature information, and updating the temperature information code in response to an external update signal based on a refresh period, wherein the temperature information output unit includes; an external update signal output unit for outputting the external update signal in response to a refresh command signal in a normal mode and outputting the external update signal in response to a self-refresh oscillation signal in a self-refresh mode, wherein the external update signal output unit includes a logic gate for performing an OR operation on the refresh command signal and the self-refresh oscillation signal and the external update signal is produced in response to an output of the logic gate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40)
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41. A semiconductor device, comprising:
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a temperature information output unit for measuring an internal temperature of the semiconductor device to generate a temperature information code and a plurality of flag signals, and updating the temperature information code in response to an external update signal, wherein the temperature information output unit includes an external update signal output unit for outputting the external update signal based on a refresh command signal in a normal mode and outputting the external update signal based on a self-refresh oscillation signal in a self-refresh mode and the external update signal output unit includes a logic gate for performing an OR operation on the refresh command signal and the self-refresh oscillation signal and the external update signal is produced in response to an output of the logic gate; a code storage unit for storing the temperature information code when the temperature information code is updated; a memory controller for changing a period of the refresh command signal by reading the temperature information code stored in the code storage unit; and a self-refresh oscillation unit for changing a period of the self-refresh oscillation signal in response to the plurality of flag signals. - View Dependent Claims (42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52)
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Specification