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On die thermal sensor

  • US 8,140,293 B2
  • Filed: 06/29/2007
  • Issued: 03/20/2012
  • Est. Priority Date: 09/28/2006
  • Status: Active Grant
First Claim
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1. An on die thermal sensor (ODTS) for use in a semiconductor device, comprising:

  • a temperature information output unit for measuring an internal temperature of the semiconductor device to generate a temperature information code having temperature information, and updating the temperature information code in response to an external update signal based on a refresh period, wherein the temperature information output unit includes;

    an external update signal output unit for outputting the external update signal in response to a refresh command signal in a normal mode and outputting the external update signal in response to a self-refresh oscillation signal in a self-refresh mode, wherein the external update signal output unit includes a logic gate for performing an OR operation on the refresh command signal and the self-refresh oscillation signal and the external update signal is produced in response to an output of the logic gate.

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