Apparatus and method for reducing average scan rate to detect a conductive object on a sensing device
First Claim
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1. A method, comprising:
- detecting a presence of a conductive object in a first area of a sensing device using a first scan of the sensing device, wherein the first area is less than an entire area of the sensing device, wherein the sensing device comprises a plurality of first scan groups, wherein each of the plurality of first scan groups comprises two or more sensor elements coupled together during the first scan; and
detecting the presence of the conductive object to determine a position of the conductive object within the first area using a second scan of the first area of the sensing device, wherein detecting the presence of the conductive object within the first area using the second scan comprises;
selecting a second scan group that includes the first area in which the presence of the conductive object is detected during the first scan, wherein the second scan group includes two or more sensor elements that are not coupled together during the second scan; and
scanning the two or more sensor elements of the selected second scan group that includes the first area during the second scan, wherein each sensor element of the two or more sensor elements is separately scanned during the second scan.
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Abstract
An apparatus and method to reduce an average scan rate to detect a conductive object on a sensing device. The method may include detecting a presence of a conductive object in a first area of a sensing device using a first scan of the sensing device, and detecting the presence of the conductive object to determine a position of the conductive object within the first area using a second scan of the first area of the sensing device. The apparatus may include a plurality of sensor elements coupled to a switch circuit. The switch circuit may include two settings for first and second scans.
199 Citations
20 Claims
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1. A method, comprising:
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detecting a presence of a conductive object in a first area of a sensing device using a first scan of the sensing device, wherein the first area is less than an entire area of the sensing device, wherein the sensing device comprises a plurality of first scan groups, wherein each of the plurality of first scan groups comprises two or more sensor elements coupled together during the first scan; and detecting the presence of the conductive object to determine a position of the conductive object within the first area using a second scan of the first area of the sensing device, wherein detecting the presence of the conductive object within the first area using the second scan comprises; selecting a second scan group that includes the first area in which the presence of the conductive object is detected during the first scan, wherein the second scan group includes two or more sensor elements that are not coupled together during the second scan; and scanning the two or more sensor elements of the selected second scan group that includes the first area during the second scan, wherein each sensor element of the two or more sensor elements is separately scanned during the second scan. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An apparatus, comprising:
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a plurality of sensor elements to detect a presence of a conductive object on the sensing device; a switch circuit coupled to the plurality of sensor elements, wherein the switch circuit is configured to group the plurality of sensor elements into multiple first scan groups and a second scan group, wherein each of the first scan groups comprises two or more of the plurality of sensor elements coupled together during the first scan, and wherein the second scan group includes two or more of the plurality of sensor elements that are not coupled together during the second scan. - View Dependent Claims (14, 15, 16, 17)
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18. An apparatus, comprising:
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a plurality of sensor elements of a sensing device; means for coupling the plurality of sensor elements into first and second scan groups, wherein the first scan group comprises two or more of the plurality of sensor elements coupled together during the first scan, and wherein the second scan group includes two or more of the plurality of sensor elements that are not coupled together during the second scan; and means for determining a position of a presence of a conductive object on the sensing device using the first and second scan groups. - View Dependent Claims (19, 20)
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Specification