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Reflective optical element for EUV lithography device

  • US 8,144,830 B2
  • Filed: 08/05/2009
  • Issued: 03/27/2012
  • Est. Priority Date: 02/05/2007
  • Status: Active Grant
First Claim
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1. A reflective optical element configured for an operating wavelength in at least one of the soft x-ray and extreme ultraviolet wavelength range, comprising:

  • a multilayer system comprising;

    at least two alternating layers of respective materials having differing real parts of the index of refraction at the operating wavelength, andat least two additional layers of further material, the at least two additional layers adjoining each other, and situated adjoining at least one of the two alternating layers,wherein the two additional layers differ respectively at a transition from the layer having a lower real part of the index of refraction to the layer having a higher real part of the index of refraction and at a transition from the layer having a higher real part of the index of refraction to the layer having a lower real part of the index of refraction.

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