Multiband spatial heterodyne spectrometer and associated methods

• US 8,154,732 B2
• Filed: 04/28/2008
• Issued: 04/10/2012
• Est. Priority Date: 04/27/2007
• Status: Expired due to Fees

• Current Assignee: Bodkin Design & Engineering, LLC
• Original Assignee: Bodkin Design and Engineering LLC
• Inventors: Bodkin, Andrew, Sheinis, Andrew I.
• Primary Examiner(s): Lyons, Michael A
• Application Number:
  US12/111,108
• Publication Number:
  US 20100321688A1
• Time in Patent Office: 1,443 Days
• Field of Search: 356/328, 356/451, 356/455, 356/456, 356/484, 356/488, 356/521
• US Class Current: 356/484
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/22 Littrow mirror spectrometers
• CPC Class Codes: G01J 3/2823 Imaging spectrometer
• CPC Class Codes: G01J 3/36 Investigating two or more bands of a spectrum by separate detectors
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes

Abstract

A multiband spatial heterodyne spectrometer for determining spectra in first and second wavelength bands has a beam splitter configured to split incident light and to direct the incident light upon a first and a second diffraction grating. The gratings are configured for Littrow reflection of incident light of the first wavelength band at a first order and Littrow reflection of incident light of the second wavelength band at a second order. Light reflected by the first and the second diffraction grating forms diffraction patterns that are imaged by an electronic camera. A dispersive device such as a prism or diffraction grating separates the imaged interference patterns onto separate rows of pixel sensors corresponding to the wavelength bands. A processing device receives information from the detector and computes spectra therefrom. In embodiments, the spectrometer is configured to compute hyperspectral images of a target.

Claims

1. A multiband spatial heterodyne spectrometer for determining spectra of incident light in at least a first and a second wavelength band comprising:

a beam splitter configured to split incident light and to direct the incident light upon a first and a second diffraction grating, wherein the first diffraction grating is configured for Littrow reflection of incident light of the first wavelength band at least one first order and Littrow reflection of incident light of the second wavelength band at least one second order, wherein the second diffraction grating is configured for Littrow reflection of light of the first wavelength band at the first order and of the second wavelength band at the second order, and wherein light reflected by the first and the second diffraction grating forms interference patterns;

an electronic camera for imaging the interference patterns, the camera comprising a detector having at least two rows of pixel sensors;

a dispersive device selected from the group consisting of a prism and a diffraction grating for separating the interference patterns into interference patterns corresponding to the first and second wavelength bands;

at least one anamorphic lens for imaging the interference patterns corresponding to the first and second wavelength bands a series of interferograms associated with different positions within the incident light on separate ones of the rows of pixel sensors; and

a processing device coupled to receive information from the detector and to compute spectra therefrom.

2. The multiband spatial heterodyne spectrometer for determining spectra of claim 1 wherein the dispersive device is a prism.

3. The multiband spatial heterodyne spectrometer for determining spectra of claim 1 wherein the dispersive device is a third diffraction grating.

4. The multiband spatial heterodyne spectrometer of claim 1 wherein the first order is in the range 10 to 400.

5. The multiband spatial heterodyne spectrometer of claim 1 further comprising a scanning mirror, and wherein the processing device constructs a hyperspectral image from the spectra.

6. The multiband spatial heterodyne spectrometer of claim 5 wherein light from a stripe of a field of view is focused through an aperture, where at least one interference pattern corresponding to incident light of a wavelength band is focused upon a plurality of rows of pixel sensors, and wherein data from the plurality of rows of pixel sensors encodes positional information within the stripe of the field of view.

7. The multiband spatial heterodyne spectrometer of claim 5 wherein the first wavelength band is in the infrared and the second wavelength band is in the visible.

8. The multiband spatial heterodyne spectrometer of claim 1 wherein the first wavelength band is in the infrared and the second wavelength band is in the visible.

9. The multiband spatial heterodyne spectrometer of claim 1 wherein the processing device is adapted to recognize emission spectra from Uranium and Plutonium.

10. The multiband spatial heterodyne spectrometer of claim 1 wherein the spectrometer is tunable by adjustment of angles of the first and the second diffraction gratings.

11. A multiband spatial heterodyne imaging device comprising:

a beam splitter configured to split light received from an aperture and to direct the light upon a first and a second diffraction grating, wherein each of the first and second diffraction grating is configured for Littrow reflection of incident light of a first wavelength band at a first order, the first order not being one, and Littrow reflection of incident light of a second wavelength band at a second order, and wherein light reflected by the first and the second diffraction grating forms interference patterns;

an electronic camera for imaging the interference patterns, the camera comprising a detector having rows of pixel sensors;

a dispersive device selected from the group consisting of a prism and a diffraction grating for separating the interference patterns into interference patterns corresponding to the first and second wavelength bands;

at least one anamorphic lens for imaging the interference patterns corresponding to the first and second wavelength bands a series of interferograms associated with different positions within the incident light on separate ones of the rows of pixel sensors;

wherein data from the plurality of rows of pixel sensors encodes positional information within the stripe of the field of view; and

a processing device coupled to receive information from the detector and to compute images therefrom.

12. The multiband spatial heterodyne imaging device of claim 11 wherein the processing device is configured to image occurrence of particular molecular species in a field of view.

13. The multiband spatial heterodyne imaging device of claim 11 further comprising a lens for collecting light into the aperture.

14. The multiband spatial heterodyne imaging device of claim 11 wherein each of the at least one anamorphic lens is a cylindrical lens.

15. The multiband spatial heterodyne imaging device of claim 11, further comprising a scanning device for scanning stripes of a field of view across the aperture.

16. A multiband spatial heterodyne spectrometer for determining spectra of incident light in at least a first and a second wavelength band comprising:

a beam splitter configured to split incident light and to direct the incident light upon a first and a second diffraction grating, wherein each of the first and second diffraction grating is configured for Littrow reflection of incident light of the first wavelength band at a first order and Littrow reflection of incident light of the second wavelength band at a second order, and wherein light reflected by the first and the second diffraction grating forms interference patterns;

an electronic camera for imaging the interference patterns, the camera comprising a first and a second detector each having at least one row of pixel sensors;

at least one dichroic filter for separating the interference patterns into interference patterns corresponding to the first and second wavelength bands, wherein the interference pattern corresponding to the first wavelength band is focused upon the first detector, and the interference pattern corresponding to the second wavelength band is focused upon the second detector; and

a processing device coupled to receive information from the first and second detectors and to compute spectra therefrom.

17. The multiband spatial heterodyne spectrometer of claim 16 wherein the first detector has spectral sensitivity differing from a spectral sensitivity of the second detector.

18. A multiband spatial heterodyne spectrometer for determining spectra of incident light in at least a first and a second wavelength band comprising:

a beam splitter configured to split incident light and to direct the incident light upon a first and a second diffraction grating, wherein the first diffraction grating is configured for Littrow reflection of incident light of the first wavelength band at a first order and Littrow reflection of incident light of the second wavelength band at a second order, wherein the second diffraction grating is configured for Littrow reflection of light of the first band at a third order, and wherein light reflected by the first and the second diffraction grating forms interference patterns;

an electronic camera for imaging the interference patterns, the camera comprising a detector having at least two rows of pixel sensors;

a dispersive device selected from the group consisting of a prism and a diffraction grating for separating the interference patterns into interference patterns corresponding to the first and second wavelength bands on separate rows of pixel sensors; and

a processing device coupled to receive information from the detector and to compute spectra therefrom.