Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay

• US 8,155,914 B2
• Filed: 09/23/2010
• Issued: 04/10/2012
• Est. Priority Date: 11/13/2007
• Status: Active Grant

• Current Assignee: Oewaves Incorporated
• Original Assignee: Oewaves Incorporated
• Inventors: Eliyahu, Danny, Maleki, Lute, Seidel, David
• Primary Examiner(s): Lau, Tung S
• Application Number:
  US12/889,398
• Publication Number:
  US 20110097078A1
• Time in Patent Office: 565 Days
• Field of Search: 702/117
• US Class Current: 702/117
• CPC Class Codes: G01R 29/26 Measuring noise figure; Measuring signal-to-noise ratio
• CPC Class Codes: G01R 31/2824 testing of oscillators or resonators
• CPC Class Codes: H04B 10/61 Coherent receivers

Abstract

Techniques and devices for measuring phase noise in radio frequency (RF), microwave, or millimeter signals based on photonic delay.

Claims

1. A device for measuring a phase noise in a signal, comprising:

an input port that receives an oscillation signal from an oscillator under test;

a first photonic signal processing branch circuit that processes the oscillation signal to produce a first branch output signal;

a second photonic signal processing branch circuit that processes the oscillation signal to produce a second branch output signal, wherein the first and second photonic signal processing branch circuits share a common optical module that includes a shared laser producing continuous wave laser light at first and second wavelengths, a shared optical modulator that modulates the laser light at the first and second wavelengths to produce modulated laser light that carries the oscillation signal, a shared optical delay that receives the modulated laser light from the shared optical modulator and a wavelength-selective optical device that separates the modulated laser light output by the shared optical delay into a first modulated laser beam at the first wavelength that is processed by the first photonic signal processing branch circuit to produce the first branch output signal and a second modulated laser beam at the second wavelength that is processed by the second photonic signal processing branch circuit to produce the second branch output signal; and

circuitry that receives the first and second branch output signals to measure noise in the received oscillation signal and controls the first and second photonic signal processing branch circuits and measurements of the noise in the received oscillation signal.

2. The device as in claim 1, wherein:

the first photonic signal processing branch circuit comprises a first optical detector that converts the first modulated laser beam into a first detector signal, a first electrical branch that comprises a first voltage controlled phase shifter that receives a first copy of the oscillator signal and changes a phase of the first copy of the oscillator signal to produce a first phase-shifted copy of the oscillator signal, and a first signal mixer that mixes the first detector signal and the first phase-shifted copy of the oscillator signal to produce the first branch output signal, and

the second photonic signal processing branch circuit comprises a second optical detector that converts the second modulated laser beam into a second detector signal, a second electrical branch that comprises a second voltage controlled phase shifter that receives a second copy of the oscillator signal and changes a phase of the second copy of the oscillator signal to produce a second phase-shifted copy of the oscillator signal, and a second signal mixer that mixes the second detector signal and the second phase-shifted copy of the oscillator signal to produce the second branch output signal.

3. The device as in claim 2, wherein:

the optical delay comprises a fiber delay line.

4. The device as in claim 2, wherein:

each of the first and second voltage controlled phase shifters is under a control of the circuitry.

5. The device as in claim 4, wherein:

the circuitry controls each of the first and second voltage controlled phase shifters to set a phase of each of the first and second signal mixers at a quadrature condition.

6. The device as in claim 1, wherein the circuitry includes:

a channel signal analyzer that receives the first and second branch output signals to measure noise in the received oscillation signal; and

a controller that controls the first and second photonic signal processing branch circuits and the channel signal analyzer to control measurements of the noise in the received oscillation signal.