Piezo-resistive detection resonant device made using surface technologies
First Claim
1. Resonant device with detection in a plane where piezo-resistive detection occurs, the resonant device made using surface micromachining substrate technologies on a bulk, characterised in that it comprises:
- a resonator connected to this bulk substrate by at least one embedded portion,means of exciting this resonator anddetection means comprising at least one suspended beam type strain gauge made from piezo-resistive material, wherein each strain gauge has at least one common plane with the resonator, and is connected, in a first end to this resonator at a point situated outside of this at least one embedded portion to increase the stress observed by this strain gauge, and in a second end to the substrate.
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Abstract
This invention relates to a resonant device with detection in the piezo-resistive plane made using surface technologies on a bulk, which comprises a resonator connected to this bulk by at least one embedded portion, means of exciting this resonator and detection means comprising at least one suspended beam type strain gauge made from piezo-resistive material, in which each strain gauge has a common plane with the resonator, and is connected to this resonator at a point situated outside of this at least one embedded portion to increase the stress observed by this strain gauge.
11 Citations
21 Claims
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1. Resonant device with detection in a plane where piezo-resistive detection occurs, the resonant device made using surface micromachining substrate technologies on a bulk, characterised in that it comprises:
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a resonator connected to this bulk substrate by at least one embedded portion, means of exciting this resonator and detection means comprising at least one suspended beam type strain gauge made from piezo-resistive material, wherein each strain gauge has at least one common plane with the resonator, and is connected, in a first end to this resonator at a point situated outside of this at least one embedded portion to increase the stress observed by this strain gauge, and in a second end to the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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Specification