Subsystems and methods for use in patch clamp systems

• US 8,163,147 B2
• Filed: 12/04/2008
• Issued: 04/24/2012
• Est. Priority Date: 05/04/2007
• Status: Active Grant

• Current Assignee: Tecella LLC
• Original Assignee: Tecella LLC
• Inventors: Tanaka, Yokichi J.
• Primary Examiner(s): Ball, J. Christopher
• Application Number:
  US12/328,451
• Publication Number:
  US 20090078589A1
• Time in Patent Office: 1,237 Days
• Field of Search: 204/403.01, 204/229.5, 204/29.7, 204/229.8, 204/229.7, 205/777.5, 205/793.5, 422/82.01, 422/82.02, 436/63, 4351734-1737
• US Class Current: 204/403.01
• CPC Class Codes: G01N 33/48728 Investigating individual cells, e.g. by patch clamp, voltage clamp investigating individual particles in general G01N15/10

Abstract

Subsystems and methods for use in patch clamp systems are provided. For example, in certain embodiments, compensation circuitry is used to compensate for non-idealities present in the patch clamp system. The accuracy of this compensation may be verified by employing, for example, circuitry that models the patch clamp system.

Claims

1. A method for determining a characteristic of a cell, the method comprising:

disconnecting clamping circuitry from a test head, the test head containing a cell;

measuring, via sensing circuitry, a natural resting potential of the cell;

storing the measured natural resting potential in memory;

re-connecting the clamping circuitry to the test head;

alternately applying to the cell, via the clamping circuitry, a first voltage substantially equal to the measured natural resting potential and a second voltage substantially equal to a sum of the measured natural resting potential and a step voltage; and

measuring, via the clamping circuitry, a characteristic of the cell.

2. The method of claim 1, wherein a different step voltage is applied on each application of the second voltage.

3. The method of claim 1, wherein the characteristic of the cell is measured during each application of the second voltage.

4. The method of claim 1, wherein the measured characteristic of the cell is current.

5. The method of claim 1, wherein a single probe is employed to measure the natural resting potential of the cell and to measure the characteristic of the cell.

6. A subsystem that determines a characteristic of a cell, the subsystem comprising:

sensing circuitry that measures a natural resting potential of a cell contained within a test head;

a memory that stores the measured natural resting potential; and

clamping circuitry that i) alternately applies to the cell a first voltage substantially equal to the measured natural resting potential and a second voltage substantially equal to a sum of the measured natural resting potential and a step voltage and ii) measures a characteristic of the cell, the clamping circuitry being in electrical communication with a switch to disconnect the clamping circuitry from the test head prior to the sensing circuitry'"'"'s measurement of the cell'"'"'s natural resting potential and to re-connect the clamping circuitry to the test head following the sensing circuitry'"'"'s measurement of the cell'"'"'s natural resting potential.

7. The subsystem of claim 6, wherein a different step voltage is applied on each application of the second voltage.

8. The subsystem of claim 6, wherein the clamping circuitry measures the characteristic of the cell during each application of the second voltage.

9. The subsystem of claim 6, wherein the measured characteristic of the cell is current.

10. The subsystem of claim 6, wherein the sensing circuitry and the clamping circuitry are each coupled to a common single probe.

11. A method for determining a characteristic of at least one cell in an electrophysiological experiment, the method comprising:

applying a stimulus to the cell through a device in a patch clamp system; and

measuring the characteristic of the cell with measurement circuitry while applying to the measurement circuitry a first compensation signal to compensate for a leakage resistance introduced by the patch clamp system and a second compensation signal to compensate for a series resistance introduced by the device, wherein the second compensation signal is related to the measured characteristic of the cell and a third compensation signal removing from the measured characteristic of the cell the effect thereon of the first compensation signal.

12. The method of claim 11, wherein the device is an electrode.

13. The method of claim 11, wherein the measured characteristic is current.

14. A patch clamp system that determines a characteristic of at least one cell in an electrophysiological experiment, the patch clamp system comprising:

a device that applies a stimulus to the cell;

measurement circuitry that measures the characteristic of the cell;

first compensation circuitry that applies to the measurement circuitry a first compensation signal to compensate for a leakage resistance introduced by the patch clamp system;

second compensation circuitry that applies to the measurement circuitry a second compensation signal to compensate for a series resistance introduced by the device, the second compensation signal related to the measured characteristic of the cell and a third compensation signal; and

third compensation circuitry that applies to the second compensation circuitry the third compensation signal, the third compensation signal removing from the measured characteristic of the cell the effect thereon of the first compensation signal.

15. The system of claim 14, wherein the device is an electrode.

16. The system of claim 14, wherein the measured characteristic is current.