Integrated circuit testing module configured for set-up and hold time testing
First Claim
1. A system comprising:
- a clock synchronization component configured to generate a clock signal for the system;
one or more input components configured to receive a signal from an automated testing equipment at a first slew rate configured to test an integrated circuit;
one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment;
a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and
one or more output components configured to convey the test signal to the integrated circuit at a second slew rate faster than the first slew rate, the integrated circuit being separable from the one or more output components.
4 Assignments
0 Petitions
Accused Products
Abstract
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test time sensitive parameters of the integrated circuit. The testing interface includes components for generating addresses, commands, and test data to be conveyed to the integrated circuit as well as a clock adjustment component. By adjusting the clock synchronization controlling the test signals to be conveyed to the integrated circuit, set-up time and hold time can be tested. The systems are configured to test set-up time and hold time of individual data channels, for example, an individual address line of the integrated circuit.
209 Citations
28 Claims
-
1. A system comprising:
-
a clock synchronization component configured to generate a clock signal for the system; one or more input components configured to receive a signal from an automated testing equipment at a first slew rate configured to test an integrated circuit; one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment; a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and one or more output components configured to convey the test signal to the integrated circuit at a second slew rate faster than the first slew rate, the integrated circuit being separable from the one or more output components. - View Dependent Claims (2, 3, 4, 5)
-
-
6. A method comprising:
-
attaching an automated testing equipment to a test module having a clock adjustment component configured to determine a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit; attaching the integrated circuit to be tested to the test module; receiving, at the test module, a signal from the automated testing equipment at a first slew rate; testing the integrated circuit according to the steps of; (a) generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment, (b) conveying a test signal to the integrated circuit, at a second slew rate faster than the first slew rate, using the adjustment to the clock synchronization, (c) receiving data from the integrated circuit responsive to the conveyed test signal, and (d) comparing the received data to an expected result. - View Dependent Claims (7, 8, 9, 10, 11, 12, 13)
-
-
14. A system comprising:
-
means for coupling a test module having a clock adjustment component between an automated testing equipment and an integrated circuit to be tested, the clock adjustment component comprising means for determining a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit; means for configuring the test module for testing of the integrated circuit; means for receiving, at the test module, a signal from the automated testing equipment at a first slew rate; and means for testing a slew rate, minimum set-up time, or minimum hold time of the integrated circuit according to the steps of; a) means for generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment, b) means for conveying a test signal to the integrated circuit, at a second slew rate faster than the first slew rate, using the adjustment to the clock synchronization, c) means for receiving data from the integrated circuit responsive to the conveyed test signal, and d) means for comparing the received data to an expected result.
-
-
15. A system comprising:
-
a clock synchronization component configured to generate a clock signal for the system; one or more input components configured to receive a signal from an automated testing equipment at a first clock frequency configured to test an integrated circuit; one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment; a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and one or more output components configured to convey the test signal to the integrated circuit at a second clock frequency higher than the first clock frequency, the integrated circuit being separable from the one or more output components. - View Dependent Claims (16, 17, 18, 19)
-
-
20. A method comprising:
-
attaching an automated testing equipment to a test module having a clock adjustment component configured to determine a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit; attaching the integrated circuit to be tested to the test module; receiving, at the test module, a signal from the automated testing equipment at a first clock frequency; testing the integrated circuit according to the steps of; (a) generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment, (b) conveying a test signal to the integrated circuit, at a second clock frequency higher than the first clock frequency, using the adjustment to the clock synchronization, (c) receiving data from the integrated circuit responsive to the conveyed test signal, and (d) comparing the received data to an expected result. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27)
-
-
28. A system comprising:
-
means for coupling a test module having a clock adjustment component between an automated testing equipment and an integrated circuit to be tested, the clock adjustment component comprising means for determining a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit; means for configuring the test module for testing of the integrated circuit; means for receiving, at the test module, a signal from the automated testing equipment at a first clock frequency; and means for testing a slew rate, minimum set-up time, or minimum hold time of the integrated circuit according to the steps of; (a) means for generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment, (b) means for conveying a test signal to the integrated circuit, at a second clock frequency higher than the first clock frequency, using the adjustment to the clock synchronization, (c) means for receiving data from the integrated circuit responsive to the conveyed test signal, and (d) means for comparing the received data to an expected result.
-
Specification