Optical device for assessing optical depth in a sample
First Claim
1. An optical device for assessing optical depth in an associated sample, the device comprising:
- a radiation source capable of emitting radiation with an initial polarization;
a first radiation guide and a second radiation guide, the first radiation guide being optically connected to the radiation source for emitting radiation to the sample, the first radiation guide and the second radiation guide having their respective end portions substantially aligned with each other, the end portions further being arranged for capturing reflected radiation from the sample;
a detector being optically connected to the first radiation guide and the second radiation guide, the detector being arranged for measuring, within an optical subband, an indication of;
a first polarization of the reflected radiation,a second polarization of the reflected radiation, said second polarization being different from the first polarization, anda first intensity and a second intensity of the reflected radiation in the first radiation guide and the second radiation guide, respectively; and
a processor operably connected to the detector, the processor being adapted to calculate a first spectral function and a second spectral function within the optical subband, the first spectral function and the second spectral function being substantially indicative of single scattering events in the sample, the first spectral function being a measure of the a difference in polarization between the first polarization of the reflected radiation and the second polarization of the reflected radiation, and the second spectral function being a measure of the a difference in intensity between the first intensity and the second intensity of the reflected radiation,wherein the processor is further arranged to calculate a measure of a correlation between the first spectral function and the second spectral function so as to assess whether the single scattering events originate from substantially the same optical depth within the sample.
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Accused Products
Abstract
An optical device for assessing optical depth in a sample illuminated by polarized radiation from a source include two radiation guides having their end portions arranged for capturing reflected radiation from the sample. A detector measures two polarizations of the reflected radiation, and two intensities of the reflected radiation in the two radiation guides, respectively. A processor is configured to calculate two pectral functions, which are indicative of single scattering events in the sample. The processor is further configured to calculate a measure of the correlation between the two spectral functions so as to assess whether the single scattering events originate from substantially the same optical depth within the sample. Thus, the causal relation between the two spectral functions can be used for assessing whether the single scattering events giving rise to the two spectral functions come from substantially the same optical depth within the sample.
4 Citations
20 Claims
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1. An optical device for assessing optical depth in an associated sample, the device comprising:
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a radiation source capable of emitting radiation with an initial polarization; a first radiation guide and a second radiation guide, the first radiation guide being optically connected to the radiation source for emitting radiation to the sample, the first radiation guide and the second radiation guide having their respective end portions substantially aligned with each other, the end portions further being arranged for capturing reflected radiation from the sample; a detector being optically connected to the first radiation guide and the second radiation guide, the detector being arranged for measuring, within an optical subband, an indication of; a first polarization of the reflected radiation, a second polarization of the reflected radiation, said second polarization being different from the first polarization, and a first intensity and a second intensity of the reflected radiation in the first radiation guide and the second radiation guide, respectively; and a processor operably connected to the detector, the processor being adapted to calculate a first spectral function and a second spectral function within the optical subband, the first spectral function and the second spectral function being substantially indicative of single scattering events in the sample, the first spectral function being a measure of the a difference in polarization between the first polarization of the reflected radiation and the second polarization of the reflected radiation, and the second spectral function being a measure of the a difference in intensity between the first intensity and the second intensity of the reflected radiation, wherein the processor is further arranged to calculate a measure of a correlation between the first spectral function and the second spectral function so as to assess whether the single scattering events originate from substantially the same optical depth within the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A catheter configured for cooperation with an associated optical device, the catheter comprising:
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a first and a second radiation guide, the first radiation guide being optically connectable to a radiation source for emitting radiation to a sample, the first radiation guide and the second radiation guide having their respective end portions substantially aligned with each other, the end portions further being arranged for capturing reflected radiation from the sample, the associated optical device comprising; a radiation source capable of emitting radiation with an initial polarization; a detector being optically connected to the first and the second radiation guides, the detector being arranged for measuring, within an optical subband, an indication of; a first polarization of the reflected radiation, a second polarization of the reflected radiation, said second polarization being different from the first polarization, and a first intensity and a second intensity of the reflected radiation in the first radiation guide and the second radiation guide, respectively; and a processor operably connected to the detector, the processor being configured to calculate a first spectral function and a second spectral function within the optical subband, the first spectral function and the second spectral function being substantially indicative of single scattering events in the sample, the first spectral function being a measure of the a difference in polarization between the first polarization of the reflected radiation and the second polarization of the reflected radiation, and the second spectral function being a measure of the a difference in intensity between the first intensity and the second intensity of the reflected radiation, the processor further being arranged to calculate a measure of a correlation between the first spectral function and the second spectral function so as to assess whether the single scattering events originate from substantially a same optical depth within the sample. - View Dependent Claims (16, 17, 18)
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19. A method for operating an optical device for assessing optical depth in a sample, the method comprising the acts of:
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emitting radiation with an initial polarization with a radiation source; arranging a first radiation guide and a second radiation guide in relation to the sample, the first radiation guide being optically connected to the radiation source for emitting radiation to the sample, the first radiation guide and the second radiation guide having their respective end portions substantially aligned with each other, the end portions further being configured for capturing reflected radiation from the sample; measuring by a detector in optical connection to the first and the second radiation guides, within an optical subband, an indication of; a first polarization of the reflected radiation, a second polarization of the reflected radiation, said second polarization being different from the first polarization, and a first intensity and a second intensity of the reflected radiation in the first radiation guide and the second radiation guide, respectively; and calculating by a processor operably connected to the detector, a first spectral function and a second spectral function within the optical subband, the first spectral function and the second spectral function being substantially indicative of single scattering events in the sample, the first spectral function being a measure of the a difference in polarization between the first polarization of the reflected radiation and the second polarization of the reflected radiation, and the second spectral function being a measure of the a difference in intensity between the first intensity and the second intensity of the reflected radiation; and calculating by the processor a measure of a correlation between the first spectral function and the second spectral function so as to assess whether the single scattering events originate from substantially the same optical depth within the sample. - View Dependent Claims (20)
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Specification