Single event upset error detection within an integrated circuit

• US 8,185,812 B2
• Filed: 12/11/2006
• Issued: 05/22/2012
• Est. Priority Date: 03/20/2003
• Status: Active Grant

• Current Assignee: Arm Limited (SoftBank Group Corp.), Board of Regents of the University of Michigan (University of Michigan)
• Original Assignee: Arm Limited (SoftBank Group Corp.), Board of Regents of the University of Michigan (University of Michigan)
• Inventors: Das, Shidhartha, Blaauw, David Theodore, Bull, David Michael
• Primary Examiner(s): BAKER, STEPHEN M
• Application Number:
  US11/636,716
• Publication Number:
  US 20070162798A1
• Time in Patent Office: 1,989 Days
• Field of Search: 714/814
• US Class Current: 714/814
• CPC Class Codes: G06F 11/0721 within a central processing unit [CPU]
• CPC Class Codes: G06F 11/0793 Remedial or corrective actions recovery from an exception in an instruction pipeline G06F9/3861; by retry G06F11/1402; for recovering from a failure of a protocol instance or entity H04L69/40
• CPC Class Codes: G06F 11/104 using arithmetic codes, i.e. codes which are preserved during operation, e.g. modulo 9 or 11 check
• CPC Class Codes: G06F 11/1608 Error detection by comparing the output signals of redundant hardware G06F11/1629, G06F11/1666 take precedence; error detection or correction in information storage based on relative movement between record carrier and transducer G11B20/18; checking static stores for correct operation G11C29/00; for logic circuits H03K19/003, H03K19/007; for pulse counters or frequency dividers H03K21/40
• CPC Class Codes: G06F 11/167 Error detection by comparing the memory output
• CPC Class Codes: G06F 11/1695 which are operating with time diversity
• CPC Class Codes: G06F 11/183 by voting, the voting not being performed by the redundant components

Abstract

An integrated circuit 2 includes logic circuitry 10 and sequential storage elements 8. Both the logic circuit 10 and sequential storage elements 8 can be subject to particle strikes giving rise to single event upset errors. These single event upset errors can be detected by detecting a transition in the stored value stored by the sequential storage elements 8 occurring outside of a valid transition period associated with that sequential storage element 8.

Claims

1. A method of detecting effects of single event upset errors within an integrated circuit, said method comprising:

sampling an input signal;

storing said input signal as sampled as a stored signal consisting of a single stored signal value within a sequential storage element;

detecting from only said single stored signal value a transition of said single stored signal value stored by said sequential storage element occurring at a time outside a valid transition period as indicating an error.

2. A method as claimed in claim 1, wherein said step of detecting detects a particle strike effect within said sequential storage element resulting in a transition of said stored signal stored by said sequential storage element outside said valid transition period.

3. A method as claimed in claim 1, wherein said step of detecting detects timing errors within said integrated circuit.

4. A method as claimed in claim 1, wherein said step of detecting is performed by transition detector circuitry.

5. A method as claimed in claim 4, comprising disabling said transition detector circuitry for a disabling period.

6. A method as claimed in claim 5, comprising:

controlling said sequential storage element with a clock signal having a first clock signal value during a first clock phase and a second clock signal value during a second clock phase;

wherein

said clock signal changing from said second clock signal value to said first clock signal value triggers a start of said disabling period.

7. A method as claimed in claim 5, comprising

controlling said sequential storage element with a clock signal having a first clock signal value during a first clock phase and a second clock signal value during a second clock phase;

wherein

said sequential storage element is responsive to said clock signal having said first clock signal value to sample said signal and said disabling period expires after said sequential storage element has sampled said input signal following said clock signal changing from said second clock signal value to said first clock signal value.

8. A method as claimed in claim 1, wherein said sequential storage element samples said input signal for a sampling period, said sampling period being longer than said valid transition period.

9. A method as claimed in claim 8, wherein said valid transition period is within said sampling period.

10. A method as claimed in claim 8, comprising:

controlling said sequential storage element with a clock signal having a first clock signal value during a first clock phase and a second clock signal value during a second clock phase.

11. A method as claimed in claim 10, wherein said sequential storage element is responsive to said clock signal having said first clock signal value to sample said signal.

12. A method as claimed in claim 11, wherein said sequential storage element is responsive to said clock signal having said second clock signal value to store said stored signal resulting from said sampling during said first clock phase.

13. A method as claimed in claim 8, comprising:

generating said input signal with logic circuitry; and

supplying said input signal to said sequential storage element.

14. A method as claimed in claim 13, wherein said step of detecting detects a particle strike effect within said logic circuitry resulting in a transition of said stored signal stored by said sequential storage element within said sampling period and outside said valid transition.

15. A method as claimed in claim 13, wherein after generating said input signal said logic circuitry generates a next input signal supplied to said sequential storage element after an evaluation delay period, said evaluation delay period expiring no earlier than expiry of said sampling period for said input signal plus a hold time for said sequential storage element.

16. A method as claimed in claim 15, comprising delaying said next input signal with at least one delay element within said logic circuitry such that said next input signal is supplied to said sequential storage element no earlier than expiry of said sampling period for said input signal.

17. An integrated circuit comprising:

a sequential storage element having an input receiving a input signal;

control circuitry coupled to said sequential storage element to control said sequential storage element to sample and store said input signal as a stored signal consisting of a single stored signal value; and

a single event upset effect detector comprising a transition detector coupled to said sequential storage element and responsive to only said single stored signal value to detect a transition of said single stored signal value stored by said sequential storage element occurring at a time outside a valid transition period as indicating an error.

18. An integrated circuit as claimed in claim 17, wherein said single event upset effect detector detects a particle strike effect within said sequential storage element resulting in a transition of said stored signal stored by said sequential storage element outside said valid transition period.

19. An integrated circuit as claimed in claim 17, wherein said transition detector detects timing errors within said integrated circuit.

20. An integrated circuit as claimed in claim 17, wherein said control circuitry disables said transition detector circuitry for a disabling period.

21. An integrated circuit as claimed in claim 20, wherein said control circuitry controls said sequential storage element with a clock signal having a first clock signal value during a first clock phase and a second clock signal value during a second clock phase and said clock signal changing from said second clock signal value to said first clock signal value triggers a start of said disabling period.

22. An integrated circuit as claimed in claim 20, wherein said control circuitry controls said sequential storage element with a clock signal having a first clock signal value during a first clock phase and a second clock signal value during a second clock phase and said sequential storage element is responsive to said clock signal having said first clock signal value to sample said input signal and said disabling period expires after said sequential storage element has sampled said input signal following said clock signal changing from said second clock signal value to said first clock signal value.

23. An integrated circuit as claimed in claim 17, wherein said control circuitry is formed so as to control said sequential storage element to sample said input signal for a sampling period, said sampling period being longer than said valid transition period.

24. An integrated circuit as claimed in claim 23, wherein said valid transition period is within said sampling period.

25. An integrated circuit as claimed in claim 23, wherein said control circuitry controls said sequential storage element with a clock signal having a first clock signal value during a first clock phase and a second clock signal value during a second clock phase.

26. An integrated circuit as claimed in claim 25, wherein said sequential storage element is responsive to said clock signal having said first clock signal value to sample said input signal.

27. An integrated circuit as claimed in claim 26, wherein said sequential storage element is responsive to said clock signal having said second clock signal value to store said signal value resulting from said sampling during said first clock phase.

28. An integrated circuit as claimed in claim 23, comprising:

logic circuitry, said logic circuitry generating said input signal for supply to said sequential storage element.

29. An integrated circuit as claimed in claim 28, wherein said single event upset effect detector detects a particle strike effect within said logic circuitry resulting in a transition of said stored signal stored by said sequential storage element within said sampling period and outside said valid transition.

30. An integrated circuit as claimed in claim 28, wherein after generating said signal said logic circuitry generates a next input signal supplied to said sequential storage element after an evaluation delay period, said evaluation delay period expiring no earlier than expiry of said sampling period for said input signal plus a hold time for said sequential storage element.

31. An integrated circuit as claimed in claim 30, comprising at least one delay element within said logic circuitry, said at least one delay element delaying said next input signal such that said next input signal is supplied to said sequential storage element no earlier than expiry of said sampling period for said input signal.