Methods of inverse determination of material properties of an electrochemical system
First Claim
1. A method of designing a thin film battery device and manufacturing the thin film battery device by determining at least one material property of at least one component of an electrochemical system using a process to reduce a difference of a performance characteristic between a numerical simulation result of a physical model and an empirical result, the method comprising:
- providing an electrochemical cell using a thin film process;
performing a plurality of tests on the electrochemical cell, using a processor, to identify one or more target performance characteristics of the electrochemical cell, the plurality of tests including respective operational modes of the electrochemical cell;
deriving a plurality of performance characteristics from the plurality of tests to provide a performance database, the performance database comprising the operational modes and the respective performance characteristics;
performing a surrogate based analysis process;
determining a plurality of outputs of the surrogate based analysis function; and
determining a value of the unknown material property.
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Abstract
A method of determining at least one material property of at least one component of an electrochemical system (fully or partially completed) using a process to reduce a difference of a performance characteristic between a numerical simulation result of a physical model and an empirical result. The method includes providing an electrochemical cell using a thin film process and performing a plurality of tests on the electrochemical cell to identify one or more target performance characteristics of the electrochemical cell. The method includes performing a surrogate based analysis process and determining a plurality of outputs of the surrogate based analysis function and determines a value of the unknown material property.
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Citations
20 Claims
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1. A method of designing a thin film battery device and manufacturing the thin film battery device by determining at least one material property of at least one component of an electrochemical system using a process to reduce a difference of a performance characteristic between a numerical simulation result of a physical model and an empirical result, the method comprising:
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providing an electrochemical cell using a thin film process; performing a plurality of tests on the electrochemical cell, using a processor, to identify one or more target performance characteristics of the electrochemical cell, the plurality of tests including respective operational modes of the electrochemical cell; deriving a plurality of performance characteristics from the plurality of tests to provide a performance database, the performance database comprising the operational modes and the respective performance characteristics; performing a surrogate based analysis process; determining a plurality of outputs of the surrogate based analysis function; and determining a value of the unknown material property. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method of designing a thin film battery device and manufacturing the thin film battery device by determining at least one material property of at least one component of an electrochemical system using a process to reduce a difference of a performance characteristic between a numerical simulation result of a physical model and an empirical result, the method comprising:
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providing an electrochemical cell using a thin film process, wherein the electrochemical cell comprises an anode, cathode, separator, electrolyte, current collectors, substrate, and an overlying barrier material; performing a plurality of tests on the electrochemical cell, using a processor, to identify one or more target performance characteristics of the electrochemical cell, the plurality of tests including respective operational modes of the electrochemical cell, wherein the plurality of tests are selected from at least one or more of a cell charge discharge test process, a temperature measurement process, a electrochemical impedance spectroscopy (EIS) test process, a strain gauge test process, a wafer bender test process, or an in-situ SEM cell charge discharge test process; deriving a plurality of performance characteristics from the plurality of tests to provide a performance database, the performance database comprising the operational modes and the respective performance characteristics; performing a surrogate based analysis process; determining a plurality of outputs of the surrogate based analysis function, wherein the determining of the output uses at least one or more of a linear equation algorithm, Levenberg-Marquardt Algorithm, Gauss-Newton Algorithm, Trust-Region Dogleg Method, Trust-Region-Reflective Methods, medium-scale algorithms, or large-scale algorithms; and determining a value of the unknown material property. - View Dependent Claims (18, 19, 20)
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Specification