Method and system for selecting test vectors in statistical volume diagnosis using failed test data
First Claim
1. A computer-implemented method, comprising:
- receiving failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits, wherein each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus and each of said failures is associated with a failed test vector;
generating ranks for each of said failures using a first ranking scheme;
annotating said ranks to the failed test vector for each of said failures in each of the plurality of integrated circuits;
generating a plurality of groups by grouping the failed test vectors in each of the plurality of integrated circuits using a grouping scheme;
assigning a group rank to each of the plurality of groups using a second ranking scheme;
selecting a first group of failed test vectors from the plurality of groups in each of the plurality of integrated circuits using a selection criterion; and
running diagnostics on the first group of failed test vectors.
1 Assignment
0 Petitions
Accused Products
Abstract
A method and system for test vector selection in statistical volume diagnosis using failed test data is disclosed. A computer-implemented method receives failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits. Each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus, and each of the plurality of failures is associated with a failed test vector. Using a first ranking scheme, each of the failures is given a rank and the corresponding failed test vector in each of the plurality of integrated circuits is annotated with the rank. The annotated failed test vectors are grouped using a grouping scheme, and each of the groups is given a group rank. A first group of failed test vectors is selected based on the group rank and diagnostics is run on the first group of failed test vectors.
-
Citations
30 Claims
-
1. A computer-implemented method, comprising:
-
receiving failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits, wherein each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus and each of said failures is associated with a failed test vector; generating ranks for each of said failures using a first ranking scheme; annotating said ranks to the failed test vector for each of said failures in each of the plurality of integrated circuits; generating a plurality of groups by grouping the failed test vectors in each of the plurality of integrated circuits using a grouping scheme; assigning a group rank to each of the plurality of groups using a second ranking scheme; selecting a first group of failed test vectors from the plurality of groups in each of the plurality of integrated circuits using a selection criterion; and running diagnostics on the first group of failed test vectors. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
-
11. A computer-readable non transitory storage medium having stored thereon a plurality of instructions, said plurality of instructions when executed by a computer, cause said computer to perform:
-
receiving failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits, wherein each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus and each of said failures is associated with a failed test vector; generating ranks for each of said failures using a first ranking scheme; annotating said ranks to the failed test vector for each of said failures in each of the plurality of integrated circuits; generating a plurality of groups by grouping the failed test vectors in each of the plurality of integrated circuits using a grouping scheme; assigning a group rank to each of the plurality of groups using a second ranking scheme; selecting a first group of failed test vectors from the plurality of groups in each of the plurality of integrated circuits using a selection criterion; and running diagnostics on the first group of failed test vectors. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
-
-
21. A diagnostic system for identifying yield limiters using a group of failed test vectors, comprising:
-
a buffer that stores failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits, wherein each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus and each of said failures is associated with a failed test vector; a diagnostic engine comprising a processor and random access memory for running diagnostics on the group of failed test vectors selected from a plurality of groups in each of said plurality of integrated circuits using a selection criteria, wherein said plurality of groups are generated by; generating ranks to each of said failures using a first ranking scheme; annotating said ranks to the failed test vectors for each of said failures in each of the plurality of integrated circuits; grouping the failed test vectors in each of said plurality of integrated circuits using a grouping scheme, and; assigning a group rank to each of the plurality of groups using a second ranking scheme. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30)
-
Specification