Method of measuring in situ differential emissivity and temperature

• US 8,192,077 B2
• Filed: 10/06/2009
• Issued: 06/05/2012
• Est. Priority Date: 09/01/2005
• Status: Expired due to Fees

• Current Assignee: Siemens Energy Incorporated (Siemens AG)
• Original Assignee: Siemens Energy Incorporated (Siemens AG)
• Inventors: Twerdochlib, Michael
• Primary Examiner(s): VERBITSKY, GAIL KAPLAN
• Application Number:
  US12/574,096
• Publication Number:
  US 20100014555A1
• Time in Patent Office: 973 Days
• Field of Search: 374/2, 374/120, 374/121, 374/126, 374/129, 374/29, 374/137, 374/166, 374/167, 374/141, 374/8, 250/338.1, 250/339.06, 250/339.09, 250/339.11, 250/338.3, 250/504.R, 250/227.18, 250/495.1, 250/339.02, 250/339.03, 2503411-3418, 250/252.2, 250/493.1, 25055941-55946, 250/339.04, 250/342, 356/43
• US Class Current: 374/129
• CPC Class Codes: G01J 2005/0074 having separate detection of emissivity
• CPC Class Codes: G01J 5/0003 for sensing the radiant heat transfer of samples, e.g. emittance meter
• CPC Class Codes: G01J 5/532 using a reference heater of the emissive surface type, e.g. for selectively absorbing materials
• CPC Class Codes: G01J 5/602 using selective, monochromatic or bandpass filtering

Abstract

A method for measuring the differential emissivity between two sites on the surface of a body and the temperature of the two sites. The method includes a plurality of measurements of the infrared radiation arising from each of the two sites under a number of different conditions. Some of the measurements include irradiation by external infrared radiation at a known wavelength and intensity. The infrared radiation arising from each of the sites may include emitted radiation, reflected ambient radiation, and reflected external radiation. Additionally, the temperature determined using the method described can be used to calibrate infrared imaging devices used to inspect the entire body.

Claims

1. A method of measuring the in situ differential emissivity between two sites on a surface of an object, comprising:

detecting infrared radiation arising at a first wavelength from a first site on a surface of a body when not irradiated by external infrared radiation;

detecting infrared radiation arising at said first wavelength from said first site while said first site is irradiated by external infrared radiation at said first wavelength;

detecting infrared radiation arising at said first wavelength from a second site on the surface of said body when not irradiated by external infrared radiation;

detecting infrared radiation arising at said first wavelength from said second site while said second site is irradiated by external infrared radiation at said first wavelength; and

determining an in situ differential emissivity value based on the detection of infrared radiation arising from said first site and said second site without irradiation by external infrared radiation and with irradiation by external infrared radiation.

2. The method of claim 1, wherein said first site and said second site are located in a highly reflected environment.

3. The method of claim 1, wherein said body is a turbine component.

4. The method of claim 3, wherein said turbine component is a turbine vane.

5. The method of claim 1, wherein said infrared radiation is detected using a device capable of narrow-band infrared radiation detection.

6. The method of claim 1, wherein said external infrared radiation is steady-state infrared radiation.

7. The method of claim 1, wherein said first site and said second site are in substantial proximity to one another.