Method and apparatus for improving yield ratio of testing

• US 8,193,819 B2
• Filed: 10/30/2009
• Issued: 06/05/2012
• Est. Priority Date: 03/20/2009
• Status: Active Grant

• Current Assignee: King Yuan Electronics Company Limited
• Original Assignee: King Yuan Electronics Company Limited
• Inventors: Wang, Wei-Ping, Ko, Hsuan-Chung
• Primary Examiner(s): He, Amy
• Application Number:
  US12/610,270
• Publication Number:
  US 20100237879A1
• Time in Patent Office: 949 Days
• Field of Search: 324/627, 324/628
• US Class Current: 324/628
• CPC Class Codes: G01R 31/2879 related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
• CPC Class Codes: G01R 31/2894 Aspects of quality control [QC] G01R31/31718 takes precedence; program control for QC G05B19/41875

Abstract

A method and apparatus for improving yield ratio of testing are disclosed. The method includes the following steps. First of all, devices are tested and electromagnetic interference is measured. Next, the test results are examined for whether the devices pass the test or not. Then, electromagnetic interference data are examined for whether the electromagnetic interference data are over a predetermined standard if the devices fail the test. The above-mentioned steps are performed again if the electromagnetic interference data are over a predetermined standard. The test is terminated if the devices still fail the test and the values of electromagnetic interference are still over a predetermined standard.

Claims

1. A method for improving yield ratio of testing, said method comprising;

(a) performing a test of a device and measurement of electromagnetic interferences;

(b) determining whether the device passes the test or not;

(c) determining whether values of the electromagnetic interference are over a predetermined standard value or not if the device fails the test;

(d) performing (a) to (c) if the values of the electromagnetic interference are over the predetermined standard value; and

(e) terminating the test if the device fails the test and the values of the electromagnetic interference are over the predetermined standard value.

2. The method according to claim 1, wherein the test of the device and measurement of electromagnetic interference are performed by a tester and an interference-receiving module respectively, and the interference-receiving module receives the electromagnetic interference and transmits the values of the electromagnetic interference to the tester.

3. The method according to claim 1, wherein other tests are performed if the device passes the test.

4. The method according to claim 1, wherein other tests are performed if the device fails the test and the values of the electromagnetic interference are not over the predetermined standard value.

5. The method according to claim 1, wherein step (e) further comprises alerting a handler controlled by the tester.

6. A test apparatus for improving yield ratio of testing, said test apparatus comprising:

a test procedure module in a tester; and

an interference-receiving module, the interference-receiving module receiving electromagnetic interference and transmitting values of the electromagnetic interference to the tester, wherein the test procedure module determines whether the electromagnetic interference affects a testing result of devices under test via performing a method for improving yield ratio of testing, the method comprising;

(a) performing a test of a device and measurement of electromagnetic interferences;

(b) determining whether the device passes the test or not;

(c) determining whether values of the electromagnetic interference are over a predetermined standard value or not if the device fails the test;

(d) performing (a) to (c) if the values of the electromagnetic interference are over the redetermined standard value; and

(e) terminating the test if the device fails the test and the values of the electomagnetic interference are over the predetermined standard value.

7. The test apparatus according to claim 6, wherein the test procedure module comprises a computer readable medium storing processor executable instructions operable to determine whether the electromagnetic interference affects a testing result of devices under test.

8. The test apparatus according to claim 6, wherein the test procedure module comprises a computer readable medium storing processor executable instructions operable to perform the method for improving yield ratio of testing.

9. The test apparatus according to claim 6, wherein the interference-receiving module comprises an antenna module.

10. The test apparatus according to claim 9, wherein the antenna module transmits electromagnetic interference signals to the tester via RF ports of the tester.

11. The test apparatus according to claim 9, wherein the interference-receiving module further comprises a RF power detector, and the RF power detector transforms received RF signals to DC voltage signals and transmits them to the tester.

12. The test apparatus according to claim 11, wherein the interference-receiving module further comprises a low noise amplifier, and the low noise amplifier amplifies and transmits the received RF signals to the RF power detector.

13. A test system for improving yield ratio of testing, said test system comprising:

a tester;

a test interface, the tester transmitting test signals to devices under test through the test interface so as to test the devices; and

an interference-receiving module, the interference-receiving module receiving electromagnetic interference and transmitting values of the electromagnetic interference to the tester, wherein the tester determines whether the electromagnetic interference affects a testing result of devices under test through performing a method for improving yield ratio of testing, the method comprising;

(a) performing a test of a device and measurement of electromagnetic interferences;

(b) determining whether the device passes the test or not;

(c) determining whether values of the electromagnetic interference are over a predetermined standard value or not if the device fails the test;

(d) performing (a) to (c) if the values of the electromagnetic interference are over the predetermined standard value; and

(e) terminating the test if the device fails the test and the values of the electromagnetic interference are over the redetermined standard value.

14. The test system according to claim 13, wherein the tester comprises a test procedure module, the test procedure module determines whether the electromagnetic interference affects a testing result of devices under test.

15. The test system according to claim 14, wherein the test procedure module comprises a computer readable medium storing processor executable instructions operable to determine whether the electromagnetic interference affects a testing result of devices under test.

16. The test system according to claim 14, wherein the test procedure module comprises a computer readable medium storing processor executable instructions operable to perform the method for improving yield ratio of testing.

17. The test system according to claim 16, wherein the interference-receiving module comprises an antenna module.

18. The test system according to claim 17, wherein the antenna module transmits electromagnetic interference signals to the tester via RF ports of the tester.

19. The test system according to claim 17, wherein the interference-receiving module further comprises a RF power detector, and the RF power detector transforms received RF signals to DC voltage signals and transmits them to the tester.

20. The test system according to claim 19, wherein the interference-receiving module further comprises a low noise amplifier, and the low noise amplifier amplifies and transmits the received RF signals to the RF power detector.