Method of measuring a lithographic projection apparatus
First Claim
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1. A method of measuring a lithographic projection apparatus, the method comprising:
- imaging a verification mark provided in a patterning device onto a radiation-sensitive layer held by a substrate table of a lithographic apparatus, wherein the verification mark comprises at least a first, a second and a third verification structure that have a mutually different sensitivity profile for a dose setting, a focus setting and a contrast setting, wherein the first verification structure comprises at least a first and a second verification pattern having mutually different focus settings, and the third verification structure has a focus setting centrally within the range of focus settings of the first and the second verification patterns.
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Abstract
A method of measuring a lithographic projection apparatus is described. The method includes imaging a verification mark of a patterning device onto a radiation-sensitive layer held by a substrate table of a lithographic apparatus, wherein the verification mark includes at least a first, a second and a third verification structure that have a mutually different sensitivity profile for a dose setting, a focus setting and a contrast setting.
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Citations
26 Claims
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1. A method of measuring a lithographic projection apparatus, the method comprising:
imaging a verification mark provided in a patterning device onto a radiation-sensitive layer held by a substrate table of a lithographic apparatus, wherein the verification mark comprises at least a first, a second and a third verification structure that have a mutually different sensitivity profile for a dose setting, a focus setting and a contrast setting, wherein the first verification structure comprises at least a first and a second verification pattern having mutually different focus settings, and the third verification structure has a focus setting centrally within the range of focus settings of the first and the second verification patterns. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of measuring a lithographic projection apparatus, the method comprising:
imaging a verification mark provided in a patterning device onto a radiation-sensitive layer held by a substrate table of a lithographic apparatus, wherein the verification mark comprises at least a first verification structure with at least a first verification pattern and a second verification pattern, the first and second verification patterns being imaged at mutually different focus settings, and a second verification structure having a focus setting centrally within the range of focus settings of the first and the second verification patterns. - View Dependent Claims (13, 14)
- 15. A patterning device configured to pattern a beam of radiation in a lithographic projection apparatus according to a desired pattern, the patterning device comprising a verification mark, wherein the verification mark comprises at least a first, a second and a third verification structure that have a mutually different sensitivity profile for a dose setting, a focus setting and a contrast setting, wherein the first verification structure comprises at least a first and a second verification pattern having mutually different focus settings, and the third verification structure has a focus setting centrally within the range of focus settings of the first and the second verification patterns.
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24. A patterning device configured to pattern a beam of radiation in a lithographic projection apparatus according to a desired pattern, the patterning device comprising a verification mark, the verification mark comprising at least a first verification structure that comprises at least a first and a second verification pattern that are arranged at a mutually different level in a direction of an axis transverse to a plane of the verification mark and having mutually different focus settings, and the verification mark comprising a second verification structure having a focus setting centrally within the range of focus settings of the first and the second verification patterns.
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25. A lithographic projection apparatus comprising:
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a substrate table configured to hold a substrate; a patterning device configured to pattern a beam of radiation according to a desired pattern, the patterning device comprising a verification mark to be imaged onto a radiation-sensitive layer held by the substrate table, wherein the verification mark comprises at least a first, a second and a third verification structure that have a mutually different sensitivity profile for a dose setting, a focus setting and a contrast setting, wherein the first verification structure comprises at least a first and a second verification pattern having mutually different focus settings, and the third verification structure has a focus setting centrally within the range of focus settings of the first and the second verification patterns; a projection system configured to image the patterned beam onto the radiation-sensitive layer.
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26. A device manufacturing method, comprising:
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using a patterning device to endow a beam of radiation with a pattern in its cross-section; projecting the patterned beam of radiation onto a substrate that is at least partially covered by a layer of radiation-sensitive material using a lithographic apparatus; and prior to the projecting, verifying the lithographic apparatus by imaging a verification mark provided in a patterning device onto a radiation-sensitive layer held by a substrate table of a lithographic apparatus, wherein the verification mark comprises at least a first, a second and a third verification structure that have a mutually different sensitivity profile for a dose setting, a focus setting and a contrast setting, wherein the first verification structure comprises at least a first and a second verification pattern having mutually different focus settings, and the third verification structure has a focus setting centrally within the range of focus settings of the first and the second verification patterns.
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Specification