Method for testing wireless connection of electronic device
First Claim
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1. A method for testing a wireless connection of an electronic device, the method comprising:
- initializing the electronic device to a stand-by state;
forming the wireless connection based on a wireless protocol between a testing server and the electronic device;
outputting a plurality of first data packages to the electronic device and receiving a plurality of second data packages from the electronic device by the testing server to test a rate of data throughput via the wireless connection;
switching the electronic device from the stand-by state to a sleep state by the testing server;
sending a wake-up signal to the electronic device via the wireless connection to the electronic device; and
recording a switch rate of data throughput via the wireless connection from the sleep state to the stand-by state of the electronic device;
wherein the testing server calculates the rate of data throughput according to a volume of the first data packages and the second data packages versus time;
if the volume falls into a pre-determined range, the rate of the data throughput is passed.
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Abstract
A method for testing a wireless connection of an electronic device includes the following steps. The electronic device is initialized to a stand-by state. A testing server connects the electronic device to form a wireless connection based on a wireless protocol. The testing server outputs a plurality of first data packages to the electronic device and receives a plurality of second data packages from the electronic device to test a rate of data throughput via the wireless connection by the testing server. A wake-up signal is sent to the electronic device via the wireless connection to the electronic device.
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Citations
1 Claim
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1. A method for testing a wireless connection of an electronic device, the method comprising:
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initializing the electronic device to a stand-by state; forming the wireless connection based on a wireless protocol between a testing server and the electronic device; outputting a plurality of first data packages to the electronic device and receiving a plurality of second data packages from the electronic device by the testing server to test a rate of data throughput via the wireless connection; switching the electronic device from the stand-by state to a sleep state by the testing server; sending a wake-up signal to the electronic device via the wireless connection to the electronic device; and recording a switch rate of data throughput via the wireless connection from the sleep state to the stand-by state of the electronic device; wherein the testing server calculates the rate of data throughput according to a volume of the first data packages and the second data packages versus time; if the volume falls into a pre-determined range, the rate of the data throughput is passed.
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Specification
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Current AssigneeHong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
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Original AssigneeHong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
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InventorsWu, Wen-Yi, Deng, Wen, Liu, Xiao-Fei
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Primary Examiner(s)Yao, Kwang B
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Assistant Examiner(s)LOUIS, VINNCELAS
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Application NumberUS12/551,730Publication NumberTime in Patent Office1,029 DaysField of Search370242-253, 370/328, 455/523, 455/423, 709/227, 704/228, 702/188US Class Current370/253CPC Class CodesH04W 24/06 Testing, supervising or mon...
