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Method and apparatus for monitoring bit-error rate

  • US 8,209,569 B2
  • Filed: 06/08/2009
  • Issued: 06/26/2012
  • Est. Priority Date: 11/21/2006
  • Status: Active Grant
First Claim
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1. A method, comprising:

  • generating, by at least one processor, a test signal exhibiting a selected bit error rate (BER) distribution profile, the selected BER distribution profile defining a change in a number of bit errors in the test signal over time; and

    providing the test signal as input to a test network.

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