Thin disk laser operations with unique thermal management

• US 8,213,471 B2
• Filed: 01/24/2011
• Issued: 07/03/2012
• Est. Priority Date: 01/22/2010
• Status: Active Grant

• Current Assignee: Integral Laser Solutions, LLC, Curators of the University of Missouri (University of Missouri)
• Original Assignee: Integral Laser Solutions, LLC, Curators of the University of Missouri (University of Missouri)
• Inventors: Schlie, LaVerne Arthur, Ma, Hongbin, Smith, Douglas E., Gruzdev, Vitaly
• Primary Examiner(s): Rodriguez, Armando
• Application Number:
  US13/012,697
• Publication Number:
  US 20110206077A1
• Time in Patent Office: 526 Days
• Field of Search: 372/35, 372/67
• US Class Current: 372/35
• CPC Class Codes: H01S 3/042 for solid state lasers H01S3/0401 takes precedence
• CPC Class Codes: H01S 3/0604 in the form of a plate or disc

Abstract

A thermal management apparatus and method for a thin disk laser system enabling the laser system to have near isothermal temperatures across and throughout a thin disk comprising a mechanically controlled oscillating heat pipe having effective thermal conductivity of 10-20,000 W/m*K that promotes near isothermal conditions in lasing of the thin disk, a thin disk lasing crystal or ceramic bonded to the mechanically controlled oscillating heat pipe, and a supporting structure including a surface bonded to the thin disk that matches the CTE (coefficient of thermal expansion) of both materials.

Claims

1. Thermal management apparatus for a thin disk laser system enabling the laser system to have isothermal temperatures across and throughout a thin disk, said apparatus comprising:

a mechanically controlled oscillating heat pipe having effective thermal conductivity of 10-20,000 W/m*K;

a thin disk lasing crystal or ceramic bonded to said mechanically controlled oscillating heat pipe; and

a supporting structure including a surface bonded to the thin disk lasing crystal or ceramic that matches the CTE (coefficient of thermal expansion) of both the thin disk lasing crystal or ceramic and the mechanically controlled oscillating heat pipe.

2. Apparatus as defined in claim 1 wherein said apparatus causes isothermal conditions across and throughout the thin disk lasing crystal or ceramic to promote equal phase fronts in axial lasing direction.

3. Apparatus as defined in claim 1 wherein said thin disk lasing crystal or ceramic is selected from the group consisting of Yb:

YAG, Nd;

YAG, Yb;

KYW, doped sesquioxides, tungstates, erbium and thullium doped crystals, doped Ca salts like Yb;

CaF₂ and doped glass.

4. Apparatus as defined in claim 1 additionally comprising nano-fluids and nano-particles to enhance desired temperature conditions and specific spatial variations desirable for specific laser performances.

5. Apparatus as defined in claim 1 wherein said apparatus is incorporated into a laser system selected from the group consisting of pulsed, cw and ultrashort laser systems.

6. Apparatus as defined in claim 1 wherein said apparatus minimizes initial thermal transient conditions in a thin disk laser optical system.

7. Apparatus as defined in claim 1 additionally comprising a heat spreader.

8. Apparatus as defined in claim 1 wherein said apparatus reduces a transient thermal lens for the thin disk laser system.

9. Apparatus as defined in claim 1 wherein said apparatus operates in a vacuum.

10. A computer comprising one or more of the apparatuses of claim 1.

11. Thermal management method for a thin disk laser system enabling the laser system to have isothermal temperatures across and throughout a thin disk, the method comprising the steps of:

mechanically controlling an oscillating heat pipe having effective thermal conductivity of 10-20,000 W/m*K;

bonding a thin disk lasing crystal or ceramic to the mechanically controlled oscillating heat pipe; and

providing a supporting structure including a surface bonded to the thin disk lasing crystal or ceramic that matches the CTE (coefficient of thermal expansion) of both the thin disk lasing crystal or ceramic and the mechanically controlled oscillating heat pipe.

12. The method as defined in claim 11 wherein the method causes isothermal conditions across and throughout the thin disk lasing crystal or ceramic to promote equal phase fronts in axial lasing direction.

13. The method as defined in claim 11 additionally comprising the step of forming a heat spreader.

14. The method as defined in claim 11 wherein the method reduces a transient thermal lens for the thin disk laser system.

15. The method as defined in claim 11 additionally comprising the step of performing the method within a computer.

16. The method as defined in claim 11 additionally comprising the step of operating in a vacuum.