Accurate parasitic capacitance extraction for ultra large scale integrated circuits
First Claim
1. A method of conducting testing and simulation, the method comprising:
- creating a technology file;
processing the geometry of an integrated circuit layout; and
using an extraction system, extracting parasitic capacitance by pattern-matching a connector configuration in said technology file from a pattern in said integrated circuit layout;
wherein said technology file includes a capacitance table;
wherein a connector capacitance in said capacitance table is derived from an effective connector area table; and
wherein each element of said effective connector area table is calibrated to have a parasitic capacitance value matching with a measured parasitic capacitance value of an actual connector configuration in an integrated circuit (IC), said actual connector configuration comprising a contact, a via, or a combination thereof.
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Abstract
A system and method for extracting the parasitic contact/via capacitance in an integrated circuit are provided. Parasitic extraction using this system can lead to an improved accuracy on contact/via parasitic capacitance extraction by taking into account of the actual contact/via shape and size variation. The common feature of the various embodiments includes the step of generating a technology file, in which the contact/via capacitance in the capacitance table is derived from an effective contact/via width table. Each element of the effective contact/via width table is calibrated to have a parasitic capacitance matching to that of an actual contact/via configuration occurring in an IC.
50 Citations
20 Claims
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1. A method of conducting testing and simulation, the method comprising:
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creating a technology file; processing the geometry of an integrated circuit layout; and using an extraction system, extracting parasitic capacitance by pattern-matching a connector configuration in said technology file from a pattern in said integrated circuit layout; wherein said technology file includes a capacitance table; wherein a connector capacitance in said capacitance table is derived from an effective connector area table; and wherein each element of said effective connector area table is calibrated to have a parasitic capacitance value matching with a measured parasitic capacitance value of an actual connector configuration in an integrated circuit (IC), said actual connector configuration comprising a contact, a via, or a combination thereof. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification