Verification process for non-volatile storage
First Claim
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1. A non-volatile storage apparatus, comprising:
- a plurality of non-volatile storage elements; and
one or more managing circuits in communication with the plurality of non-volatile storage elements, the one or more managing circuits perform a particular erase function on a set of non-volatile storage elements and separately perform verification for different overlapping and contiguous subsets of the non-volatile storage elements in response to the particular erase function.
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Abstract
When erasing non-volatile storage, a verification process is used between erase operations to determine whether the non-volatile storage has been successfully erased. The verification process includes separately performing verification for different subsets of the non-volatile storage elements.
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Citations
26 Claims
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1. A non-volatile storage apparatus, comprising:
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a plurality of non-volatile storage elements; and one or more managing circuits in communication with the plurality of non-volatile storage elements, the one or more managing circuits perform a particular erase function on a set of non-volatile storage elements and separately perform verification for different overlapping and contiguous subsets of the non-volatile storage elements in response to the particular erase function. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A non-volatile storage apparatus, comprising:
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a plurality of non-volatile storage elements; and one or more managing circuits in communication with the plurality of non-volatile storage elements; the one or more managing circuits apply one or more testing signals to a first contiguous and connected group of non-volatile storage elements, sense condition information for the first contiguous and connected group of non-volatile storage elements in response to the one or more testing signals applied to the first contiguous and connected group of non-volatile storage elements, apply one or more testing signals to a second contiguous and connected group of non-volatile storage elements that overlaps with the first contiguous and connected group of non-volatile storage elements, and sense condition information for the second contiguous and connected group of connected non-volatile storage elements in response to the one or more testing signals applied to the second contiguous and connected group of non-volatile storage elements. - View Dependent Claims (12)
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13. A non-volatile storage apparatus, comprising:
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a plurality of non-volatile storage elements; and one or more managing circuits in communication with the plurality of non-volatile storage elements, the one or more managing circuits apply multiple sets of testing signals at different times to overlapping and contiguous subsets of non-volatile storage devices, the one or more managing circuits sense condition information of non-volatile storage elements receiving the testing signals, the one or more managing circuits perform the sensing at the different times and in response to the testing signals. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21)
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22. A non-volatile storage apparatus, comprising:
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a plurality of non-volatile storage elements; and one or more managing circuits in communication with the plurality of non-volatile storage elements, the one or more managing circuits perform an erase function on the plurality of non-volatile storage elements, the one or more managing circuits separately apply testing signals to different subsets of non-volatile storage devices including applying a different testing signal to a non-volatile storage element at an edge of a particular subset as compared to non-volatile storage elements not at edges of the particular subset, the one or more managing circuits apply overdrive signals to non-volatile storage elements not in a subset being sensed while applying the testing signals, the overdrive signals are different than the testing signals, the different subsets of the non-volatile storage elements include contiguous and connected non-volatile storage elements, the one or more managing circuits sense condition information for the different subsets in response to the testing signals, the sensing condition information is an attempt to verify the erase function. - View Dependent Claims (23, 24, 25, 26)
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Specification