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Mark extension for analysis of long record length data

  • US 8,223,151 B2
  • Filed: 01/25/2008
  • Issued: 07/17/2012
  • Est. Priority Date: 01/25/2008
  • Status: Active Grant
First Claim
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1. A method of analysis of long record length data acquired by a test and measurement instrument, said long record length data representing an acquired input signal using marks, comprising the steps of:

  • generating a mark for a defined interesting event of a number of different interesting events in the long record length data, the mark having a start location, focus and duration with respect to the long record length data;

    displaying, on a display screen of said test and measurement instrument, a waveform indicative of a portion of the long record length data in a zoom display together with the mark, the mark having indicia including the duration;

    repeating the generating step for each occurrence of the defined interesting event in the long record length data to generate a plurality of marks, each having a starting location, focus and duration with respect to the long record length data; and

    ,using said marks to gate measurements of said interesting event of said long record length data.

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