Dimensional detection system calibration method

• US 8,228,510 B2
• Filed: 12/13/2011
• Issued: 07/24/2012
• Est. Priority Date: 05/21/2010
• Status: Expired due to Fees

• Current Assignee: Nielco, Inc.
• Original Assignee: LTS Scale Company, LLC (Libra Invest Nederland BV)
• Inventors: Pangrazio, John Gregory, Pangrazio, John Alan, Pangrazio, Robert Thomas, Brey, Kenneth Lloyd, Pena-Gutierrez, Cesar
• Primary Examiner(s): NGUYEN, SANG H
• Application Number:
  US13/324,149
• Publication Number:
  US 20120081714A1
• Time in Patent Office: 224 Days
• Field of Search: 356600-625, 3562431-2438, 382/153, 382/154, 382/141, 382/165, 348/47, 348/42, 348/94, 348/135, 358/1.9, 358/504, 358/505, 358/514, 358/518
• US Class Current: 356/614
• CPC Class Codes: B66F 17/003 for fork-lift trucks
• CPC Class Codes: B66F 9/0755 Position control; Position detectors
• CPC Class Codes: G01B 11/00 Measuring arrangements characterised by the use of optical techniques

Abstract

An improved dimensional detection system is portable and can be used to characterize a workpiece. The dimensional detection system employs as few as a single focused light source and as few as a single camera along with a calibration data set to convert the illuminated pixels of an image of a beam on the workpiece into a cloud of real world points in space on an outer surface of the workpiece. The cloud of points can be processed to characterize the workpiece, such as by determining the right hexahedron that would encompass all of the real world points in space and which could be used to determine a dimensional weight of the workpiece.

Claims

1. A method of generating a calibration data set for a measurement apparatus that comprises a focused light source that is structured to project a beam onto a workpiece, an image collection device that is structured to detect a reflection of the beam on the workpiece and to generate a number of images, and an image analysis device that has access to the calibration data set, the image collection device and the image analysis device being in electronic communication, the method comprising:

projecting a beam oriented at a predetermined angle oblique to a reference axis onto a calibration platform that comprises a plurality of indices and that is disposed at each of a plurality of positions along the reference axis;

capturing at each position of at least some of the plurality of positions an image that comprises a number of illuminated pixels representative of at least a portion of the beam on at least some of the indices of the calibration platform at the position;

for each image, employing the position of the calibration platform along the reference axis and a representation of the calibration platform to generate for each of at least some of the illuminated pixels a point in space that is representative of a point on a surface of the calibration platform at the position along the reference axis that is illuminated by the beam; and

generating a calibration data set from at least some of the points in space.

2. The method of claim 1, further comprising generating as the calibration data set a data set that comprises a number of coefficients that correspond with the predetermined angle and that are usable in a number of equations to enable an illuminated pixel of an image of a workpiece that is illuminated by an analysis beam at the predetermined angle to be transformed into a point in space that corresponds with a point on a surface of the workpiece that is illuminated by the analysis beam.

3. The method of claim 2, further comprising:

projecting onto the calibration platform another beam oriented at another predetermined angle oblique to the reference axis;

capturing at each of a plurality of positions of the calibration platform along the reference axis another image that comprises a number of illuminated pixels representative of at least a portion of the another beam on the calibration platform; and

for each such another image, employing the position of the calibration platform along the reference axis and the representation of the calibration platform to generate for each of at least some of the illuminated pixels another point in space that is representative of a point on the surface of the calibration platform at the position along the reference axis that is illuminated by the beam; and

employing the another points in space to generate as a part of the calibration data set another data set that comprises another number of coefficients that correspond with the another predetermined angle and that are usable in the number of equations to enable an illuminated pixel of an image of the workpiece that is illuminated by another analysis beam at the another predetermined angle to be transformed into a point in space that corresponds with a point on the surface of the workpiece that is illuminated by the another analysis beam.