Spectrometer and a method for controlling the spectrometer
First Claim
1. A spectrometer for material analysis comprising:
- a radiant source formed by multiple single radiation sources having different central wavelengths, for generating a measuring signal,a measurement object containing a material to be analyzed,at least one electrically tunable Fabry-Perot filter for band pass filtering the measuring signal by at least two pass bands for the used signal wavelength range, anda detector for detecting said filtered measuring signals received from the measurement object,whereinthe spectrometer has means for modulating each of the single radiation sources and correspondingly means for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector, andthe spectrometer has means for detecting and demodulating multiple pass bands simultaneously.
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Abstract
The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). The spectrometer has: means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400); and means for detecting (300, 400) and demodulating (306, 307) multiple pass hands simultaneously.
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Citations
14 Claims
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1. A spectrometer for material analysis comprising:
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a radiant source formed by multiple single radiation sources having different central wavelengths, for generating a measuring signal, a measurement object containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter for band pass filtering the measuring signal by at least two pass bands for the used signal wavelength range, and a detector for detecting said filtered measuring signals received from the measurement object, wherein the spectrometer has means for modulating each of the single radiation sources and correspondingly means for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector, and the spectrometer has means for detecting and demodulating multiple pass bands simultaneously. - View Dependent Claims (2, 3, 4, 5, 6, 13, 14)
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7. A control method for a spectrometer for material analysis, which method comprises the following steps:
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generating a measurement signal by a radiant source formed by multiple single radiation sources having different central wavelengths, directing the measurement signal to a measurement object containing a material to be analyzed, filtering the measurement signal by at least one electrically tunable Fabry-Perot filter by at least two pass bands for the used signal wavelength range, and detecting said filtered measuring signals received from the measurement object, wherein the method further comprises modulating each of the single radiation sources and correspondingly demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector and detecting and demodulating multiple pass bands simultaneously. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification