System comprising a semiconductor device and structure
First Claim
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1. A semiconductor device, comprising:
- a first semiconductor layer comprising first transistors, wherein said first transistors are interconnected by at least one metal layer comprising aluminum or copper; and
a second mono-crystallized semiconductor layer comprising second transistors and overlaying said at least one metal layer,wherein said at least one metal layer is in-between said first semiconductor layer and said second mono-crystallized semiconductor layer,wherein said second mono-crystallized semiconductor layer is less than 150 nm in thickness, andwherein at least one of said second transistors is an N-type transistor and at least one of said second transistors is a P-type transistor.
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Abstract
A system includes a semiconductor device. The semiconductor device includes a first semiconductor layer comprising first transistors, wherein the first transistors are interconnected by at least one metal layer comprising aluminum or copper. The second mono-crystallized semiconductor layer includes second transistors and is overlaying the at least one metal layer, wherein the second mono-crystallized semiconductor layer is less than 150 nm in thickness, and at least one of the second transistors is an N-type transistor and at least one of the second transistors is a P-type transistor.
541 Citations
30 Claims
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1. A semiconductor device, comprising:
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a first semiconductor layer comprising first transistors, wherein said first transistors are interconnected by at least one metal layer comprising aluminum or copper; and a second mono-crystallized semiconductor layer comprising second transistors and overlaying said at least one metal layer, wherein said at least one metal layer is in-between said first semiconductor layer and said second mono-crystallized semiconductor layer, wherein said second mono-crystallized semiconductor layer is less than 150 nm in thickness, and wherein at least one of said second transistors is an N-type transistor and at least one of said second transistors is a P-type transistor. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A semiconductor device comprising:
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a first semiconductor layer comprising first transistors, wherein said first transistors are interconnected by at least one metal layer comprising aluminum or copper; a second mono-crystallized semiconductor layer comprising second transistors and overlaying said at least one metal layer, wherein said at least one metal layer is in-between said first semiconductor layer and said second mono-crystallized semiconductor layer; and a plurality of connection paths between said second transistors and said first transistors, wherein said plurality of connection paths comprise vias through said second mono-crystallized semiconductor layer, wherein at least one of said vias is less than about 150 nm in diameter, and wherein said second transistors comprise horizontally oriented transistors. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A semiconductor device comprising:
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a first semiconductor layer comprising first alignment marks and first transistors, wherein said first transistors are interconnected by at least one metal layer comprising aluminum or copper; a second mono-crystallized semiconductor layer comprising second transistors and overlaying said at least one metal layer, wherein said at least one metal layer is in-between said first semiconductor layer and said second mono-crystallized semiconductor layer, and a plurality of connection paths between said second transistors and said first transistors, wherein said second transistors comprise horizontally oriented transistors, and wherein at least one of said connection paths has a contact to said second transistors wherein said contact is aligned to one of said first alignment marks. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22)
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23. A 3D IC based system comprising:
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a first semiconductor layer comprising first alignment marks and first transistors, wherein said first transistors are interconnected by at least one metal layer comprising aluminum or copper; a second mono-crystallized semiconductor layer comprising second transistors and overlaying said at least one metal layer, wherein said at least one metal layer is in-between said first semiconductor layer and said second mono-crystallized semiconductor layer; and a reusable donor wafer, wherein said second transistors comprise horizontally oriented transistors, and wherein said second mono-crystallized semiconductor layer is transferred from said reusable donor wafer. - View Dependent Claims (24, 25, 26, 27, 28, 29, 30)
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Specification