Bi-directional high side current sense measurement

• US 8,237,449 B2
• Filed: 05/27/2010
• Issued: 08/07/2012
• Est. Priority Date: 05/27/2010
• Status: Active Grant

• Current Assignee: Microchip Technology Incorporated
• Original Assignee: Standard Microsystems Corporation (Microchip Technology Incorporated)
• Inventors: Rallabandi, Madan G., McLeod, Scott C.
• Primary Examiner(s): Valone, Thomas
• Application Number:
  US12/788,896
• Publication Number:
  US 20110291675A1
• Time in Patent Office: 803 Days
• Field of Search: 324/522
• US Class Current: 324/522
• CPC Class Codes: G01R 1/203 Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R
• CPC Class Codes: G01R 19/10 Measuring sum, difference or ratio

Abstract

A system for measuring a voltage drop between two nodes in an electrical circuit, comprising a switched capacitor integrator (SCI), a comparator and a counter. The SCI alternately (a) captures charge onto a set of sampling capacitors and (b) selectively accumulates/transfers the charge onto a pair of integration capacitors, where the charge includes a first portion that is based on the voltage drop and a second portion that depends on a digital indicator signal. The comparator generates the digital indicator signal based on whether an analog output of the SCI is positive or negative. The counter counts a number of ones occurring in the digital indicator signal during a measurement interval. At the end of the measurement interval, the count value represents a measure of the voltage drop. Knowing the resistance between the two nodes, the voltage drop may be converted into a current measurement.

Claims

1. A system for measuring a voltage drop between two nodes in an electrical circuit, the system comprising:

a switched capacitor integrator (SCI) coupled to the two nodes and configured to alternately (a) capture samples of charge onto a set of sampling capacitors and (b) selectively accumulate the charge samples onto a pair of integration capacitors, wherein the charge samples include a first charge sample based on the voltage drop and a second charge sample based on a reference voltage, wherein said selectively accumulating includes accumulating the first charge sample, wherein said selectively accumulating includes accumulating the second charge sample only if a digital indicator signal equals one, wherein the SCI is configured to generate an analog output signal that corresponds to a total accumulated charge on the integration capacitors;

a comparator circuit configured to generate the digital indicator signal based on the analog output signal, wherein the digital indicator signal indicates whether the analog output signal is positive or negative at each active edge of a clock signal;

a counter configured to count a number of ones occurring in the digital indicator signal during a measurement interval, wherein, at the end of the measurement interval, the number represents a measure of the voltage drop.

2. The system of claim 1, wherein the electrical circuit includes a battery, a load, and a sense resistor, wherein the two nodes correspond to the two ends of the sense resistor.

3. The system of claim 1, wherein the electrical circuit includes a battery, a battery charger and a sense resistor, wherein the two nodes correspond to the two ends of the sense resistor.

4. The system of claim 1, wherein the electrical circuit includes a resistor coupled between the two nodes, wherein the system further comprises:

a means for computing a current through the resistor based on said number and a known resistance value of the resistor.

5. The system of claim 1, wherein the charge samples also include a third charge sample that is based on an offset voltage.

6. The system of claim 5, wherein the offset voltage is set equal to one-half of the reference voltage.

7. The system of claim 1, wherein the analog output signal equals an integral of a signal given by the expression:

G1*Vsense−

G2*VREF*dout, wherein Vsense is the voltage drop, wherein VREF is the reference voltage, wherein dout is the digital indicator signal, wherein G1 and G2 are gain factors determined by capacitances of the sampling capacitors and capacitances of the integration capacitors.

8. The system of claim 1, wherein the SCI includes a first set of switches and a second set of switches, wherein switches of the first set are configured to close during a first phase interval of the clock signal, wherein switches of the second set are configured to close during a second phase interval of the clock signal, wherein the first phase interval and the second phase interval are disjoint intervals.

9. The system of claim 1, wherein the sampling capacitors include a pair of input capacitors configured to capture the first charge sample, wherein the sampling capacitors also include a pair of reference capacitors configured to capture the second charge sample, wherein a ratio of a capacitance of the input capacitors to a capacitance of the reference capacitors is set to obtain a desired voltage gain of said system.

10. The system of claim 1, wherein the sampling capacitors include a pair of input capacitors that are configured to capture the first charge sample, wherein the capacitance of the input capacitors is greater than a capacitance of the integration capacitors.

11. The system of claim 1, wherein the sampling capacitors include a pair of input capacitors that are configured to capture the first charge sample, wherein the SCI includes a first pair of gated connections between the two nodes and the pair of input capacitors, wherein the SCI also includes a second pair of gated cross connections between the two nodes and the pair of input capacitors.

12. The system of claim 1, wherein the SCI includes an operational transconductance amplifier (OTA).

13. The system of claim 1, wherein the SCI is configured to reset the total accumulated charge on the integration capacitors to zero at the end of the measurement interval.

14. A method for measuring a voltage drop between two nodes in an electrical circuit, the method comprising:

capturing samples of charge onto a set of sampling capacitors;

selectively accumulating the charge samples onto a pair of integration capacitors in an integrator circuit, wherein the charge samples include a first charge sample that is based on the voltage drop and a second charge that is based on a reference voltage, where said selectively accumulating includes accumulating the first charge sample, wherein said selectively accumulating includes accumulating the second charge sample only if a digital indicator signal equals one;

generating the digital indicator signal based on an analog output of the integrator circuit, wherein the digital indicator signal indicates whether the analog output is positive or negative at each active edge of a clock signal;

counting a number of ones occurring in the digital indicator signal during a measurement interval, wherein, at the end of the measurement interval, the number represents a measure of the voltage drop.

15. The method of claim 14, wherein the electrical circuit includes a resistor coupled between the two nodes, wherein the method further comprises:

computing a current through the resistor based on said number and a known resistance value of the resistor.

16. The method of claim 14, wherein the electrical circuit includes a resistor coupled between the two nodes, wherein the method further comprises:

computing a power delivered to a load based on said number and a known value of voltage at one of the two nodes.

17. The method of claim 14, wherein the charge samples also include a third charge sample that is based on an offset voltage.

18. A system for measuring a voltage drop between two nodes in an electrical circuit, the system comprising:

a switched capacitor integrator (SCI) coupled to the two nodes and configured to alternately (a) capture charge onto a set of sampling capacitors and (b) transfer the charge onto a pair of integration capacitors, wherein the charge includes at least a first charge component that is based on the voltage drop, wherein the SCI is configured to generate an output signal that represents an amplification of the voltage drop;

an analog-to-digital converter (ADC) configured to capture measurements of the output signal, wherein the measurements of the output signal represents measurements of the voltage drop, wherein the SCI is configured to zero any charge on the integration capacitors after the ADC captures each measurement of the output signal.

19. The system of claim 18, wherein the ADC is a dual slope ADC.

20. The system of claim 18, wherein the ADC is a pipelined ADC.

21. The system of claim 18, wherein the ADC is a delta-sigma ADC.

22. The system of claim 18, wherein the charge also includes a second charge component that is based on an offset voltage.