Apparatus for and a method of determining surface characteristics

• US 8,239,163 B2
• Filed: 05/26/2011
• Issued: 08/07/2012
• Est. Priority Date: 11/22/2005
• Status: Expired due to Fees

• Current Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Original Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Inventors: Mansfield, Daniel Ian
• Primary Examiner(s): Bui, Bryan
• Application Number:
  US13/116,541
• Publication Number:
  US 20120004888A1
• Time in Patent Office: 439 Days
• Field of Search: 702/167, 702/183, 356/511, 356/512
• US Class Current: 702/167
• CPC Class Codes: G01B 9/02057 by using common path configuration, i.e. reference and object path almost entirely overlapping
• CPC Class Codes: G01B 9/02084 Processing in the Fourier or frequency domain when not imaged in the frequency domain
• CPC Class Codes: G01B 9/02089 Displaying the signal, e.g. for user interaction
• CPC Class Codes: G01B 9/0209 Low-coherence interferometers
• CPC Class Codes: G01B 9/04 Measuring microscopes
• CPC Class Codes: Y10T 29/49124 On flat or curved insulated base, e.g., printed circuit, etc.

Abstract

A coherence scanning interferometer carries out: a coherence scanning measurement operation on a surface area using a low numeric aperture objective so that the pitch of the surface structure elements is less that the spread of the point spread function at the surface to obtain structure surface intensity data; and a coherence scanning measurement operation on a non-structure surface area to obtain non-structure surface intensity data. A frequency transform ratio determiner determines a frequency transform ratio related to the ratio between the structure surface intensity data and the non-structure surface intensity data. A structure provider sets that frequency transform ratio equal to an expression representing the electric field at the image plane of the interferometer in terms of surface structure element size (height or depth) and width-to-pitch ratio and derives the surface structure element size and width-to-pitch ratio using the frequency transform ratio.

Claims

1. Apparatus for determining surface structure element characteristics, wherein the apparatus comprises a data processor, the data processor comprising a structure determiner:

wherein the structure determiner includes;

an intensity data storage for holding;

a) structure intensity data comprising a first series of intensity values resulting from a measurement operation by an interferometer on a surface structure sample area using an objective such that the spread of light from a light source of the interferometer at the sample surface is greater than a surface characteristic of surface structure elements of the surface structure sample area and b) non-structure intensity data comprising a second series of intensity values resulting from a measurement operation on a second sample surface area not having the surface structure; and

a controller coupled to the data storage, the controller being configured to cause the structure determiner;

to determine a transform ratio relating to a ratio between the structure intensity data and the non-structure intensity data;

to determine values for surface characteristics of the surface structure sample area by applying the determined transform ratio to a relationship representing the structure of the surface structure sample area.

2. Apparatus according to claim 1, wherein the interferometer is a coherence scanning interferometer.

3. Apparatus according to claim 1, wherein the light source is a broadband light source.

4. Apparatus according to claim 1, wherein the controller further causes the structure determiner to relate a frequency transform ratio to a relationship representing the electric field at an image plane of the interferometer in terms of the structure of the surface structure sample area.

5. Apparatus according to claim 1, wherein the controller further causes the structure determiner to relate the transform ratio to a relationship representing the electric field at an image plane of the interferometer in terms of the structure of the surface structure sample area in directions along and perpendicular to the surface.

6. Apparatus according to claim 1, wherein the controller further causes the structure determiner to relate the transform ratio to a relationship representing the electric field at an image plane of the interferometer in terms of the structure of the surface structure sample area in a first direction along the surface and a second direction transverse to the surface.

7. Apparatus according to claim 6, wherein the structure in the first direction comprises at least one of a width and a separation of the surface structure elements.

8. Apparatus according to claim 6, wherein the structure in the second direction comprises a depth or height of the surface structure elements.

9. Apparatus according to claim 6, wherein the structure in the first direction comprises at least one of a width and a pitch of the surface structure elements and the structure in the second direction comprises a depth or height of the surface structure elements.

10. Apparatus according to claim 1, wherein the surface characteristic of surface structure elements of the surface structure sample area is a separation of the surface structure elements.

11. Apparatus for determining surface structure element characteristics, wherein the apparatus comprises a data processor, the data processor comprising a structure determiner:

wherein the structure determiner includes;

an intensity data storage for holding;

a) structure intensity data comprising a first series of intensity values resulting from a measurement operation by an interferometer on a surface structure sample area using an objective such that the spread of light from a light source of the interferometer at the sample surface is greater than a separation between surface structure elements of the surface structure sample area, and b) non-structure intensity data comprising a second series of intensity values resulting from a measurement operation on a second sample surface area not having the surface structure; and

a controller coupled to the data storage, the controller being configured to cause the structure determiner;

to determine a frequency transform ratio relating to a ratio between the structure intensity data and the non-structure intensity data;

to determine values for at least one of said first and second structure measures as a result of applying the frequency transform ratio to a relationship representing the electric field at an image plane of the interferometer in terms of a first structure measure representing a ratio between structure characteristics of the surface structure elements along the surface and a second structure measure representing the structure characteristics of the surface structure elements in a direction transverse to the sample surface.

12. Apparatus according to claim 11, wherein the first structure measure represents a ratio between the width and a separation of the surface structure elements.

13. Apparatus according to claim 11, wherein the second structure measure represents a height or depth of the surface structure elements.

14. Apparatus according to claim 11, wherein the first structure measure represents a ratio between the width and a separation of the surface structure elements and the second structure measure represents a height or depth of the surface structure elements.

15. A method of determining surface structure element characteristics for use with an intensity data storage, a structure determiner and a controller, comprising:

determining, by the structure determiner under control of the controller, a frequency transform ratio relating to a ratio between structure intensity data and non-structure intensity data stored in the intensity data storage, the structure intensity data comprising a first series of intensity values resulting from a measurement operation by a broadband interferometer on a surface structure sample area where the spread of light from a broadband light source of the interferometer at the sample surface is greater than a separation of surface structure elements of the surface structure sample area, and the non-structure intensity data comprising a second series of intensity values resulting from a measurement operation on a second sample surface area not having the surface structure;

relating, by the structure determiner under control of the controller, the frequency transform ratio to a relationship representing the electric field at an image plane of the interferometer in terms of a first structure measure representing a ratio between the width and separation of the surface structure elements and a second structure measure representing the height or depth of the surface structure elements in a direction transverse to the sample surface; and

applying, by the structure determiner under control of the controller, the frequency transform ratio to a relationship representing the electric field at an image plane of the interferometer in terms of a first structure measure representing a ratio between the width and separation of the surface structure elements and a second structure measure representing the height or depth of the surface structure elements in a direction transverse to the sample surface to determine values for at least one of said first and second structure measures as a result of applying the frequency transform ratio to the relationship.