Stimulated emission and enhanced detection of chemicals and chemical compounds

• US 8,242,450 B2
• Filed: 12/25/2008
• Issued: 08/14/2012
• Est. Priority Date: 12/26/2007
• Status: Active Grant

• Current Assignee: Alva Labs, LLC
• Original Assignee: Richard Graziano
• Inventors: Graziano, Richard
• Primary Examiner(s): Hannaher, Constantine
• Application Number:
  US12/344,246
• Publication Number:
  US 20100051814A1
• Time in Patent Office: 1,328 Days
• Field of Search: 250/341.1
• US Class Current: 250/341.1
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 21/64 Fluorescence; Phosphorescence
• CPC Class Codes: G01N 21/65 Raman scattering

Abstract

A method and apparatus for remotely detecting, locating, and identifying chemicals and chemical compounds through optically opaque materials. Electromagnetic radiation in the Terahertz range emitted from an antenna array is modulated to excite target molecules. The apparatus then stops the excitation energy and the molecules emit an electromagnetic signature detectable by the device at standoff distances.

Claims

1. An apparatus to detect target materials, comprising:

an oscillator to generate oscillating THz electromagnetic emission pulses;

an antenna to direct the THz electromagnetic emission pulses towards target materials; and

a detector to detect signature emissions of excited molecules in the target materials;

wherein the target materials do not require sample preparation, and are at a distance of at least 10 meters from the detector.

2. The apparatus of claim 1, further comprising:

a power amplifier to boost the signal strength of the THz electromagnetic emission; and

a modulator to modulate the frequency of the THz electromagnetic emission over the frequency spectrum of the target materials.

3. The apparatus of claim 2, wherein the modulator is a sweep frequency generator.

4. The apparatus of claim 2, further comprising a computer, said computer applying a modulation algorithm and analyzing detected signature emissions.

5. The apparatus of claim 4, further comprising one or more digital signal processors in communication with said computer.

6. The apparatus of claim 2, further comprising a waveguide propagating the oscillator signal to the amplifier.

7. The apparatus of claim 2, further comprising a feedback detector receiving the modulated THz electromagnetic emission.

8. The apparatus of claim 1, wherein the oscillator is a backward wave oscillator.

9. The apparatus of claim 1, wherein the antenna is a horn antenna.

10. The apparatus of claim 1, wherein the target materials are at a distance of at least 25 meters from the detector.

11. The apparatus of claim 1, wherein the target materials are at a distance of at least 50 meters from the detector.

12. The apparatus of claim 1, wherein the target materials are at a distance of at least 100 meters from the detector.

13. The apparatus of claim 1, wherein the target materials are at a distance of at least 250 meters from the detector.

14. A method to detect target materials, comprising the steps of:

emitting electromagnetic radiation in the Terahertz range;

modulating the electromagnetic radiation to excite molecules in the target materials; and

detecting signature emissions of excited molecules in the target materials;

wherein the target materials do not require sample preparation, and the steps of emitting, modulating and detecting are performed at a distance of at least 10 meters from the target materials.

15. The method of claim 14, wherein the steps of emitting, modulating and detecting are performed at a distance of at least 50 meters from the target materials.