Methods of parametric testing in digital circuits

• US 8,244,492 B2
• Filed: 03/09/2011
• Issued: 08/14/2012
• Est. Priority Date: 02/06/2008
• Status: Expired due to Fees

• Current Assignee: DFT Microsystems, Inc.
• Original Assignee: DFT Microsystems, Inc.
• Inventors: Hafed, Mohamed M.
• Primary Examiner(s): WACHSMAN, HAL D
• Application Number:
  US13/044,309
• Publication Number:
  US 20110161755A1
• Time in Patent Office: 524 Days
• Field of Search: 702/69, 702/79, 702/117, 702/125, 702/78
• US Class Current: 702/69
• CPC Class Codes: G01R 31/31858 Delay testing

Abstract

Delay-fault testing and parametric analysis systems and methods utilizing one or more variable delay time-base generators. In embodiments of the delay-fault testing systems, short-delay logic paths are provided with additional scan-chain memory elements and logic that, in conjunction with the one or more variable-delay time-base generators, provides the effect of over-clocking without the need to over-clock. Related methods provide such effective over-clocking. In embodiments of parametric analysis systems, test point sampling elements and analysis circuitry are clocked as a function of the output of the one or more variable-delay time-base generators to provide various parametric analysis functionality. Related methods address this functionality.

Claims

1. A method of measuring a parameter of a signal under test in an integrated circuit, comprising:

providing the integrated circuit that generates the periodic signal, wherein the periodic signal has a frequency;

generating from within the integrated circuit a time-base signal having the frequency of the periodic signal and a variable delay relative to the periodic signal;

performing a test that includes sampling, with a one-bit sampler over a number N of cycles of the time-base signal, the periodic signal in response to the time-base signal a plurality of times each having a differing value of the variable delay; and

for each of the plurality of times, counting over the N cycles the number of sampled occurrences of a particular bit value captured by the one-bit sampler.

2. A method according to claim 1, wherein said generating of the time-base signal comprises continually selecting between differing delayed versions of a reference clock to provide a combined signal and, then, phase-filtering the combined signal.

3. A method according to claim 2, wherein said generating of the time-base signal further comprises generating a phase-delay selection signal for continually selecting between the differing delayed versions of the reference clock as a function of contents of a circulating memory.

4. A method according to claim 3, further comprising changing the contents of the circulating memory so as to provide the differing value of the variable delay for ones of the plurality of times of said sampling.

5. A method according to claim 1, wherein the parameter of the signal under test is delay and the method further comprises:

setting a current delay value in the time-base signal;

wherein said counting includes, using the current delay value, counting the number of times the one-bit sampler generates either a logical “

1”

or a logical “

0”

over the N cycles so as to provide a count value;

if the count value after N cycles is within a desired tolerance of N/2, reporting the current delay value as a measured delay value;

if the count value after N cycles is either greater than or less than, depending on whether the logical “

1”

or logical “

0”

is being counted, N/2, incrementing or decrementing the current delay value; and

following said incrementing or decrementing, repeating said counting, said reporting and said incrementing or decrementing until the measured delay value is reported.

6. A method according to claim 5, wherein said sampling of the periodic signal includes sampling a mission-mode clock signal.

7. A method according to claim 5, wherein when it is desired to measure temperature effects on the delay, the method further comprises:

providing a temperature-sensitive delay element in communication with a input of the one-bit sampler, the temperature-sensitive delay element providing the periodic signal;

performing said counting, said reporting and said incrementing or decrementing in logical order over a period of time so as to produce a plurality of measured delay values.

8. A method according to claim 7, wherein said providing of the temperature-sensitive delay element includes providing the temperature-sensitive delay element proximate a logic block and the method further comprises, while performing said counting, said reporting and said incrementing or decrementing in logical order over the period of time, increasing switching activity in the logic block so as to increase the temperature of the temperature-sensitive delay element.

9. A method according to claim 1, wherein the parameter of the signal under test is jitter and the method comprises:

sweeping the variable delay of the time base signal; and

while sweeping the variable delay, performing said sampling and said counting so as to generate a set of counts.

10. A method according to claim 9, further comprising:

repeatingly sweeping the variable delay;

repeatingly performing said counting so as to generate a series of sets of counts; and

using the series of sets of counts, constructing a jitter histogram and/or a probability distribution function.