Method for fast, robust, multi-dimensional pattern recognition
First Claim
1. In a pattern matching method for determining the absence or presence of instances of a pattern in an image where the pattern includes a representation of an object, and for determining the location of each found instance within a multi-dimensional space, a method for evaluating an extent of translation overlap of a pair of search results, the method comprising:
- using a processor programmed to perform the steps of;
computing an x-overlap term;
computing a y-overlap term; and
computing a product of the x-overlap term and the y-overlap term to provide an extent of translation overlap.
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Accused Products
Abstract
Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurali of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.
259 Citations
33 Claims
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1. In a pattern matching method for determining the absence or presence of instances of a pattern in an image where the pattern includes a representation of an object, and for determining the location of each found instance within a multi-dimensional space, a method for evaluating an extent of translation overlap of a pair of search results, the method comprising:
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using a processor programmed to perform the steps of; computing an x-overlap term; computing a y-overlap term; and computing a product of the x-overlap term and the y-overlap term to provide an extent of translation overlap. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 21, 22, 23, 28)
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11. An apparatus for determining the absence or presence of instances of a pattern in an image where the pattern includes a representation of an object, and for determining the location of each found instance within a multi-dimensional space, the apparatus for evaluating an extent of translation overlap of a pair of search results, the apparatus comprising:
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a processor programmed to perform the steps of; computing an x-overlap term; computing a y-overlap term; and computing a product of the x-overlap term and the y-overlap term to provide an extent of translation overlap. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 24, 25, 26, 27)
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29. In a two-dimensional pattern matching data processing product for evaluating an extent of translation overlap of a pair of possible found instances of the the pattern within a multi-dimensional space, the product tangibly embodied in a non-transitory and processor readable medium, the product comprising instructions being operable to cause a data processing apparatus to:
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compute an x-overlap term; compute a y-overlap term; and compute a product of the x-overlap term and the y-overlap term to provide the extent of translation overlap. - View Dependent Claims (30, 31, 32, 33)
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Specification