Evaluation method of device layer structure design for light emitting device, evaluation apparatus and light emitting device

• US 8,257,126 B2
• Filed: 06/26/2008
• Issued: 09/04/2012
• Est. Priority Date: 07/23/2007
• Status: Expired due to Fees

• Current Assignee: Sumitomo Chemical Company Limited
• Original Assignee: Sumitomo Chemical Company Limited
• Inventors: Sakano, Fumihiro
• Primary Examiner(s): Won, Bumsuk
• Application Number:
  US12/669,697
• Publication Number:
  US 20100194261A1
• Time in Patent Office: 1,531 Days
• Field of Search: 445/3, 445/4, 445/63, 445/64, 313498-512
• US Class Current: 445/3
• CPC Class Codes: G06F 30/20 Design optimisation, verification or simulation optimisation, verification or simulation of circuit designs G06F30/30
• CPC Class Codes: G06F 30/23 using finite element methods [FEM] or finite difference methods [FDM]
• CPC Class Codes: H10K 50/852 comprising a resonant cavity structure, e.g. Bragg reflector pair

Abstract

The present invention is intended to evaluate outgoing light from a light emitting device including a structure in which four or more layers of thin films, including a light-emitting layer, are laminated, in a shorter period of computation time, as compared with conventional methods. An evaluation method for the device layer structure design of a light emitting device is a method for evaluating outgoing light from a light emitting device including a structure in which four or more layers of thin films, including a light-emitting layer, are laminated, using an information processing apparatus, the method including: an input step (S01) of inputting parameters of the thin films constituting the light emitting device and information indicating a spectrum of light emitted from the light-emitting layer; a spectrum calculation step (S03) of generating information based on the parameters input in the input step and indicating the light emitting device divided into meshes only in the lamination direction of the thin films, and calculating a spectrum of outgoing light from the light emitting device by an FDTD method using the generated information and the information indicating the spectrum of the light emitted from the light-emitting layer; and a spectrum information output step (S03) of outputting information indicating the calculated spectrum of outgoing light.

Claims

1. An evaluation method for a device layer structure design of a light emitting device for evaluating outgoing light from the light emitting device including a structure having four or more layers of thin films, including a light-emitting layer, laminated therein, using an information processing apparatus, the method being characterized by including:

an input step of inputting parameters of the thin films constituting the light emitting device and information indicating a spectrum of light emitted from the light-emitting layer;

a spectrum calculation step of generating information based on the parameters input in the input step and indicating the light emitting device divided into meshes only in the lamination direction of the thin films, and calculating a spectrum of outgoing light from the light emitting device by an FDTD method using the generated information and the information indicating the spectrum of the light emitted from the light-emitting layer input in the input step; and

a spectrum information output step of outputting information indicating the spectrum of outgoing light from the light-emitting device calculated in the spectrum calculation step.

2. The evaluation method for the device layer structure design of a light emitting device according to claim 1, characterized in that the parameters of the thin films include the thicknesses and the refractive indexes of the thin films.

3. The evaluation method for the device layer structure design of a light emitting device according to claim 1, further including a parameter output step of determining whether or not information indicating a spectrum of outgoing light from each light emitting device output in the spectrum information output step as the result that parameters of the thin films associated with a plurality of light emitting devices are input in the input step satisfies previously-set predetermined conditions, and outputting parameters of the thin films input in the input step for a light emitting device associated with information indicating the spectrum of the outgoing light that has been determined as satisfying the conditions.

4. The evaluation method for the device layer structure design of a light emitting device according to claim 3, characterized in that the previously-set predetermined conditions are such that the value of a ratio of strength at the peak frequency of the spectrum of the outgoing light to strength at the peak frequency of the spectrum of light emitted from the light-emitting layer is a predetermined threshold value or larger.

5. An evaluation apparatus for a device layer structure design of a light emitting device for evaluating outgoing light from the light emitting device including a structure having four or more layers of thin films, including a light-emitting layer, laminated therein, the evaluation apparatus being characterized by comprising:

input means for inputting parameters of the thin films constituting the light emitting device and information indicating a spectrum of light emitted from the light-emitting layer;

spectrum calculation means for generating information based on the parameters input by the input means and indicating the light emitting device divided into meshes only in the lamination direction of the thin films and calculating a spectrum of outgoing light from the light emitting device by an FDTD method using the generated information and the information indicating the spectrum of the light emitted from the light-emitting layer input by the input means; and

spectrum information output means for outputting information indicating the spectrum of outgoing light from the light-emitting device calculated by the spectrum calculation means.