Dynamic power control of a memory device thermal sensor
First Claim
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1. A system comprising:
- a memory controller including;
a storage element to store a delay value specifying a delay period; and
thermal sensor control logic coupled to the storage element, the thermal sensor control logic to send an enable indication from the memory controller, the thermal sensor control logic further to send a thermal data sense indication in response to an expiration of the specified delay period after the sending the enable indication;
a dynamic random access memory (DRAM) device coupled with the memory controller, the DRAM device including,enable logic to receive the enable indication from the memory controller and to assert an enable signal in response to the enable indication; and
an on-die thermal sensor coupled with the enable logic, wherein the enable signal is to power on the on-die thermal sensor, wherein the thermal data sense indication is to trigger a measurement by the on-die thermal sensor, wherein the delay period is based upon a set-up time for allowing the on-die thermal sensor to stabilize after powering on.
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Abstract
Embodiments of the invention are generally directed to systems, methods, and apparatuses for the dynamic power control of a memory device thermal sensor. In some embodiments a memory device includes an on-die thermal sensor and enable logic to dynamically enable or disable the on-die thermal sensor. In some embodiments, the on-die thermal sensor senses thermal data responsive to a thermal data sense indication. The thermal data sense indication may be received subsequent to the expiration of a delay period.
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Citations
18 Claims
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1. A system comprising:
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a memory controller including; a storage element to store a delay value specifying a delay period; and thermal sensor control logic coupled to the storage element, the thermal sensor control logic to send an enable indication from the memory controller, the thermal sensor control logic further to send a thermal data sense indication in response to an expiration of the specified delay period after the sending the enable indication; a dynamic random access memory (DRAM) device coupled with the memory controller, the DRAM device including, enable logic to receive the enable indication from the memory controller and to assert an enable signal in response to the enable indication; and an on-die thermal sensor coupled with the enable logic, wherein the enable signal is to power on the on-die thermal sensor, wherein the thermal data sense indication is to trigger a measurement by the on-die thermal sensor, wherein the delay period is based upon a set-up time for allowing the on-die thermal sensor to stabilize after powering on. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A memory controller device comprising:
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a storage element to store a delay value specifying a delay period based upon a set-up time for allowing an on-die thermal sensor of a memory device to stabilize after powering on, the memory controller to couple to the memory device; and thermal sensor control logic coupled to the storage element, the thermal sensor control logic to send an enable indication from the memory controller to enable logic of the memory device, wherein the enable logic asserts an enable signal in response to the enable indication, the enable signal to power on the on-die thermal sensor, the thermal sensor control logic further to send a thermal data sense indication to trigger a measurement by the on-die thermal sensor, wherein the thermal data sense indication is sent in response to an expiration of the specified delay period after the sending the enable indication. - View Dependent Claims (10, 11, 12, 13)
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14. A method at a memory controller device, the method comprising:
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storing a delay value specifying a delay period based upon a set-up time for allowing an on-die thermal sensor of a memory device to stabilize after powering on, wherein the memory controller is coupled to the memory device; sending an enable indication from the memory controller to enable logic of the memory device, wherein the enable logic asserts an enable signal in response to the enable indication, the enable signal to power on the on-die thermal sensor; and sending a thermal data sense indication to trigger a measurement by the on-die thermal sensor, wherein the thermal data sense indication is sent in response to an expiration of the specified delay period after the sending the enable indication. - View Dependent Claims (15, 16, 17, 18)
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Specification