Trench MOSFET having shielded electrode integrated with trench Schottky rectifier
First Claim
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1. An integrated circuit comprising a plurality of trench MOSFETs and a plurality of trench Schottky rectifiers horizontally disposed in to different areas further comprising:
- a substrate of a first conductivity type;
an epitaxial layer of said first conductivity type over said substrate said epitaxial layer having a lower doping concentration than said substrate;
a plurality of gate trenches extending into said epitaxial layer;
a trench MOSFET comprising a gate electrode over a shielded electrode in said gate trench wherein said gate electrode and said shielded electrode insulated from each other by an inter-electrode insulation layer wherein said gate electrode insulated from a source region of said first conductivity type and body region of a second conductivity type by a first gate insulation layer and said shield electrode insulated from said epitaxial layer by a second gate insulation layer;
said gate electrode surrounded by said source region encompassed in said body region above said shielded electrode;
said gate electrode connected to a gate metal and said shielded electrode to a source metal;
a source-body contact trench opened in said trench MOSFET through said source region and extended into said body region and filled with a contact metal plug overlying a barrier metal layer therein, said contact metal plug filled in said source-body contact trench connected to said source metal;
a trench Schottky rectifier formed into said epitaxial layer in a different area from said trench MOSFET had having a Schottky barrier layer lined in a Schottky contact trench filled with said contact metal plug overlying said barrier metal layer directly contacting said Schottky contact trench bottom and sidewalls, and between a pair of adjacent gate trenches wherein said source and body regions do not exist, said contact metal plug filled in said Schottky contact trench connected with an anode metal;
said gate trenches in said trench MOSFET and trench Schottky rectifier having a greater trench depth than said Schottky contact trench into said epitaxial layer;
said Schottky rectifier formed at least along sidewalls of said Schottky contact trench in said epitaxial layer, separated from said pair of adjacent gate trenches by said epitaxial layer without having said source and body regions surrounding said Schottky contact trench sidewalls;
at least a gate contact trench in trench MOSFET area opened through a contact insulation layer and extended into said gate electrode in a wide gate trench having greater trench width than said gate trenches in said trench MOSFET area, and filled with said contact metal plug overlying said barrier metal layer therein, said contact metal plug filled in said gate contact trench connected with said gate metal; and
said source metal and said anode metal connected together as a source/anode metal.
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Abstract
A trench MOSFET having shielded gate in parallel with trench Schottky rectifier is formed on a single chip to further increase the efficiency of the trench MOSFET having shielded electrode. As the size of present device is getting smaller and smaller, the trench Schottky rectifier of this invention is able to be shrink and, at the same time, to achieve lower forward voltage drop and lower reverse leakage current.
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Citations
20 Claims
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1. An integrated circuit comprising a plurality of trench MOSFETs and a plurality of trench Schottky rectifiers horizontally disposed in to different areas further comprising:
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a substrate of a first conductivity type; an epitaxial layer of said first conductivity type over said substrate said epitaxial layer having a lower doping concentration than said substrate; a plurality of gate trenches extending into said epitaxial layer; a trench MOSFET comprising a gate electrode over a shielded electrode in said gate trench wherein said gate electrode and said shielded electrode insulated from each other by an inter-electrode insulation layer wherein said gate electrode insulated from a source region of said first conductivity type and body region of a second conductivity type by a first gate insulation layer and said shield electrode insulated from said epitaxial layer by a second gate insulation layer; said gate electrode surrounded by said source region encompassed in said body region above said shielded electrode; said gate electrode connected to a gate metal and said shielded electrode to a source metal; a source-body contact trench opened in said trench MOSFET through said source region and extended into said body region and filled with a contact metal plug overlying a barrier metal layer therein, said contact metal plug filled in said source-body contact trench connected to said source metal; a trench Schottky rectifier formed into said epitaxial layer in a different area from said trench MOSFET had having a Schottky barrier layer lined in a Schottky contact trench filled with said contact metal plug overlying said barrier metal layer directly contacting said Schottky contact trench bottom and sidewalls, and between a pair of adjacent gate trenches wherein said source and body regions do not exist, said contact metal plug filled in said Schottky contact trench connected with an anode metal; said gate trenches in said trench MOSFET and trench Schottky rectifier having a greater trench depth than said Schottky contact trench into said epitaxial layer; said Schottky rectifier formed at least along sidewalls of said Schottky contact trench in said epitaxial layer, separated from said pair of adjacent gate trenches by said epitaxial layer without having said source and body regions surrounding said Schottky contact trench sidewalls; at least a gate contact trench in trench MOSFET area opened through a contact insulation layer and extended into said gate electrode in a wide gate trench having greater trench width than said gate trenches in said trench MOSFET area, and filled with said contact metal plug overlying said barrier metal layer therein, said contact metal plug filled in said gate contact trench connected with said gate metal; and said source metal and said anode metal connected together as a source/anode metal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification