Radio frequency microscope for amplifying and analyzing electromagnetic signals by positioning the monitored system at a locus of an ellipsoidal surface

• US 8,275,738 B2
• Filed: 05/27/2009
• Issued: 09/25/2012
• Est. Priority Date: 05/27/2009
• Status: Active Grant

• Current Assignee: Oracle America, Inc. (Oracle Corporation)
• Original Assignee: Oracle America, Inc. (Oracle Corporation)
• Inventors: Gross, Kenny C., Dhanekula, Ramakrishna C., McElfresh, David K.
• Primary Examiner(s): VINCENT, DAVID ROBERT
• Application Number:
  US12/473,173
• Publication Number:
  US 20100306165A1
• Time in Patent Office: 1,217 Days
• Field of Search: 706/12, 706/52, 706/62, 706/916, 977/852, 324/501, 324/537, 324/76.11
• US Class Current: 706/62
• CPC Class Codes: G01R 29/0871 Complete apparatus or systems; circuits, e.g. receivers or amplifiers G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857
• CPC Class Codes: G01R 31/308 using non-ionising electromagnetic radiation, e.g. optical radiation investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00

Abstract

One embodiment provides a technique for analyzing a target electromagnetic signal radiating from a monitored system. During the technique, the monitored system is positioned at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface. Next, the amplified target electromagnetic signal is monitored using an antenna positioned at the second locus of the ellipsoidal surface. Finally, the integrity of the monitored system is assessed by analyzing the amplified target electromagnetic signal monitored by the antenna.

Claims

1. A method for analyzing a target electromagnetic signal radiating from a monitored system, comprising:

positioning the monitored system at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface;

monitoring the amplified target electromagnetic signal using an antenna positioned at the second locus of the ellipsoidal surface; and

assessing the integrity of the monitored system by analyzing the amplified target electromagnetic signal monitored by the antenna,

wherein the first locus and the second locus are at opposing focal points of the ellipsoidal surface.

2. The method of claim 1, wherein the target electromagnetic signal is generated by executing a load script on the monitored system.

3. The method of claim 1, wherein positioning the monitored system at the first locus of the ellipsoidal surface involves:

placing the monitored system on a programmable positioning table; and

horizontally moving the programmable positioning table to position one or more components in the monitored system at the first locus.

4. The method of claim 3, wherein analyzing the amplified target electromagnetic signal involves:

analyzing the amplified target electromagnetic signal radiating from the one or more components at the first locus.

5. The method of claim 1, wherein the ellipsoidal surface comprises a smooth metallic reflective surface.

6. The method of claim 1, wherein the ellipsoidal surface comprises an upper hemisphere of an ellipsoid.

7. The method of claim 6, wherein the ellipsoidal surface further comprises at least a portion of a lower hemisphere of the ellipsoid.

8. The method of claim 1, wherein analyzing the amplified target electromagnetic signal involves:

generating a target electromagnetic-signal fingerprint from the amplified target electromagnetic signal;

feeding the target electromagnetic-signal fingerprint into a pattern-recognition model;

producing an estimated electromagnetic-signal fingerprint using the pattern-recognition model; and

comparing the target electromagnetic-signal fingerprint to the estimated electromagnetic-signal fingerprint.

9. The method of claim 1, wherein the antenna comprises a near-isotropic antenna.

10. The method of claim 1, wherein assessing the integrity of the monitored system involves at least one of:

assessing an authenticity of one or more components in the monitored system;

detecting a presence of metal whiskers in the monitored system;

detecting electromigration in the monitored system;

detecting electromechanical degradation in the monitored system; and

detecting electrical connection degradation in the monitored system.

21. The method of claim 7, wherein the ellipsoidal surface fully encloses the antenna and the monitored system.

11. A system for analyzing a target electromagnetic signal radiating from a monitored system, comprising:

an ellipsoidal surface;

a positioning apparatus configured to position the monitored system at a first locus of the ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface;

an antenna positioned at the second locus of the ellipsoidal surface, wherein the antenna is configured to monitor the amplified target electromagnetic signal; and

an analysis apparatus configured to assess the integrity of the monitored system by analyzing the amplified target electromagnetic signal monitored by the antenna,

wherein the first locus and the second locus are at opposing focal points of the ellipsoidal surface.

12. The system of claim 11, further comprising:

an execution mechanism configured to generate the target electromagnetic signal by executing a load script on the monitored system.

13. The system of claim 11,

wherein the positioning apparatus corresponds to a programmable positioning table, and

wherein positioning the monitored system at the first locus of the ellipsoidal surface involves horizontally moving the programmable positioning table to position one or more components in the monitored system at the first locus.

14. The system of claim 13, wherein analyzing the amplified target electromagnetic signal involves:

analyzing the amplified target electromagnetic signal radiating from the one or more components at the first locus.

15. The system of claim 11, wherein the ellipsoidal surface comprises a smooth metallic reflective surface.

16. The system of claim 11, wherein the ellipsoidal surface comprises an upper hemisphere of an ellipsoid.

17. The system of claim 16, wherein the ellipsoidal surface further comprises at least a portion of a lower hemisphere of the ellipsoid.

18. The system of claim 11, wherein analyzing the amplified target electromagnetic signal involves:

generating a target electromagnetic-signal fingerprint from the amplified target electromagnetic signal;

feeding the target electromagnetic-signal fingerprint into a pattern-recognition model;

producing an estimated electromagnetic-signal fingerprint using the pattern-recognition model; and

comparing the target electromagnetic-signal fingerprint to the estimated electromagnetic-signal fingerprint.

19. The system of claim 11, wherein the antenna comprises a near-isotropic antenna.

20. The system of claim 11, wherein assessing the integrity of the monitored system involves at least one of:

assessing an authenticity of one or more components in the monitored system;

detecting a presence of metal whiskers in the monitored system;

detecting electromigration in the monitored system;

detecting electromechanical degradation in the monitored system; and

detecting electrical connection degradation in the monitored system.