Illumination unit for the generation of optical sectional images in transparent media, in particular in the eye

• US 8,277,047 B2
• Filed: 11/11/2002
• Issued: 10/02/2012
• Est. Priority Date: 11/12/2001
• Status: Expired due to Fees

• Current Assignee: Carl Zeiss Meditec AG (Carl-Zeiss-Stiftung)
• Original Assignee: Carl Zeiss Meditec AG (Carl-Zeiss-Stiftung)
• Inventors: Koschmieder, Ingo
• Primary Examiner(s): Cattungal, Sanjay
• Application Number:
  US10/473,460
• Publication Number:
  US 20040116811A1
• Time in Patent Office: 3,613 Days
• Field of Search: 351/214, 351/206, 351/219, 351/211, 351/221, 600407-410, 600476-480
• US Class Current: 351/214
• CPC Class Codes: A61B 3/135 Slit-lamp microscopes

Abstract

Illumination unit for the generation of optical sectional images in transparent media, particularly in the eye is disclosed. In the arrangement according to the invention, the low-divergence beams emitted by a laser serving as illumination source are imaged on or in the eye under examination by a reflection element which is controllable in a defined manner and beam deflection elements present in the beam path. The optical sectional images resulting in and on the eye can be observed and/or recorded, further processed and evaluated with an image processing unit in a known manner. In the solution according to the invention, a sectional image is generated by the deliberate periodic beam deflection of a particularly fine laser beam with high depth of focus, which sectional image remains sharp through the entire dimension of the object to be examined and makes possible an improved evaluation. The intensity of the laser beam bundle can be varied in such a way that it is sufficient for observation and documentation, but so that the diameter of the beam bundle is fine enough for a high detail resolution.

Claims

1. An slit lamp comprising:

a laser being provided as an illumination source; and

one reflection element that, during use of the illumination unit, is controllable by a drive voltage in a defined manner for the deliberate deflection of the laser beam and is tiltable about two axes independent from one another;

wherein the one reflection element is controlled such that an amplitude of an oscillation of the one reflection element is proportional to the drive voltage, and the deliberate deflection generates optical sectional images in transparent media; and

wherein each of the two independent axes, about which the reflection element is tiltable, is arranged to always intersect both with an upstream beam path and with a downstream beam path of the laser beam which is deflected by the reflection element.

2. The slit lamp according to claim 1;

wherein the beam emitted by the laser serving as illumination source has a low divergence; and

/or

wherein the beam emitted by the laser is in the blue or green spectral region; and

/or

wherein the intensity of the illumination unit is controllable; and

/or

wherein the illumination unit has beam-shaping elements.

3. The slit lamp according to claim 1;

wherein the illumination source is a laser diode module.

4. The slit lamp according to claim 1;

wherein an oscillation frequency and the amplitude of the oscillation of the reflection element are controllable;

wherein the reflection element is a mirror of small dimensions; and

wherein the reflection element is a microscanner mirror chip of any type of construction.

5. An ophthalmological examination instrument;

wherein it contains an slit lamp according to claim 1;

wherein the illumination unit is used in combination with a conventional illumination device and can be switched on when needed, or wherein the illumination unit is used separately from the conventional illumination device and can be added optionally;

wherein additional documentation devices are provided;

wherein there is an additional automatic image evaluation for obtaining measurement values of the object under examination; and

wherein the documentation device can be tilted at an angle for increasing the depth of focus according to the Scheimpflug condition so as to improve acquisition of the spatial extent of the sectional image through its entire dimension.