Methods and apparatus for vibration testing using multiple sine sweep excitation

• US 8,281,659 B2
• Filed: 07/12/2010
• Issued: 10/09/2012
• Est. Priority Date: 07/15/2009
• Status: Active Grant

• Current Assignee: ATA Engineering, Inc.
• Original Assignee: ATA Engineering, Inc.
• Inventors: Napolitano, Kevin
• Primary Examiner(s): SAINT SURIN, JACQUES M
• Application Number:
  US12/834,732
• Publication Number:
  US 20110146406A1
• Time in Patent Office: 820 Days
• Field of Search: 735/79, 735/97, 736/02, 736/64, 738/08
• US Class Current: 73/579
• CPC Class Codes: G01M 5/0016 of aircraft wings or blades
• CPC Class Codes: G01M 5/0066 by exciting or detecting vibration or acceleration vibration testing of structures G01M7/00
• CPC Class Codes: G01M 7/022 Vibration control arrangements, e.g. for generating random vibrations

Abstract

A multi-sine vibration testing method includes coupling a vibratory excitation source and a sensor to a test structure, then providing a reference signal to the excitation source, wherein the reference signal comprises a first sinusoidal waveform having a first frequency and a second sinusoidal waveform having a second frequency different from the first frequency. The first frequency and the second frequency each sweep between a corresponding start value and a corresponding end value, and the frequency response is measured from each of the sensors while providing the reference signal.

Claims

1. A method of performing vibration testing of a test structure having a plurality of vibratory excitation sources and a sensor coupled thereto, the method comprising:

providing respective reference signals to the plurality of vibratory excitation sources to impart respective dynamically changing forces to the test structure, the respective reference signals comprising a first sinusoidal waveform having a first swept frequency and a second sinusoidal waveform having a second swept frequency different from the first swept frequency, wherein the first swept frequency and the second swept frequency each sweep between a corresponding start value and a corresponding end value, and wherein the respective dynamically changing forces are mathematically independent; and

measuring a frequency response function from the sensor while providing the respective reference signals.

2. The method of claim 1, wherein the first swept frequency and the second swept frequency sweep logarithmically.

3. The method of claim 1, wherein the ratio of the first frequency to the second frequency is substantially constant.

4. The method of claim 1, further comprising:

coupling a second vibratory excitation source to the test structure; and

providing a second reference signal to the second vibratory excitation source, the second reference signal comprising a third sinusoidal waveform having a third swept frequency different from the first swept frequency and the second swept frequency, wherein the third swept frequency sweeps between a corresponding start value and a corresponding end value.

5. The method of claim 4, wherein the first reference signal and the third reference signal are antisymmetrical.

6. A method of performing vibration testing of a test structure having a vibratory excitation source and a sensor coupled thereto, the method comprising:

providing a reference signal to the vibratory excitation source, the reference signal comprising a first sinusoidal waveform having a first swept frequency and a second sinusoidal waveform having a second swept frequency different from the first swept frequency, wherein the first swept frequency and the second swept frequency each sweep between a corresponding start value and a corresponding end value; and

measuring a frequency response function from the sensor while providing the reference signal,

coupling a second excitation source to the test structure; and

providing a second reference signal to the second excitation source, the second reference signal comprising a third sinusoidal waveform having a third swept frequency different from the first swept frequency and the second swept frequency, wherein the third swept frequency sweeps between a corresponding start value and a corresponding end value,

wherein the start value of the first swept frequency is a maximum value of a range of the first swept frequency, and wherein the start value of the third swept frequency is approximately a mid-span value of a range of the third swept frequency.

7. A system for performing vibration testing of a test structure, the system comprising:

a plurality of excitation sources mechanically coupled to the test structure, each excitation source adapted to receive a respective reference signal and impart a respective dynamically changing force to the test structure responsive to the respective reference signal, wherein the respective dynamically changing forces are mathematically independent;

a plurality of sensors coupled to the test structure, each sensor adapted to measure a respective dynamic response of the test structure; and

a multi-sine signal generator coupled to the plurality of excitation sources, the multi-sine signal generator configured to produce a plurality of multi-sine signal sweeps, each multi-sine signal sweep corresponding to one or more of the reference signals, and wherein at least one of the respective reference signals includes two or more sinusoidal waveforms having substantially independent frequency characteristics.

8. The system of claim 7, wherein the plurality of sensors comprise a plurality of accelerometers.

9. The system of claim 7, wherein the plurality of excitation sources includes a plurality of shakers.

10. The system of claim 7, wherein the plurality of multi-sine signal sweeps vary logarithmically over time.

11. The system of claim 7, wherein the reference signals are selectably configured as antisymmetrical or symmetrical with respect to the excitation sources and test structure.

12. The system of claim 7, wherein the test structure is an aircraft structure, and wherein the plurality of excitation sources include at least wing excitation sources.

13. A method of determining a frequency response function of a test structure, comprising:

applying a plurality of mathematically independent force excitations to the test structure at a respective plurality of distinct locations on the test structure, the force excitations each including two independent sinusoidal waveforms provided simultaneously;

continuously modifying the two independent sinusoidal waveforms while sensing a dynamic response of the test structure; and

determining the frequency response function based on the dynamic response of the test structure.

14. The method of claim 13, wherein continuously modifying the two independent sinusoidal waveforms includes sweeping the two independent sinusoidal waveforms between respective start and end frequency values such that the two independent sinusoidal waveforms remain independent.

15. The method of claim 14, wherein the two independent sinusoidal waveforms are modified logarithmically as a function of time.

16. The method of claim 15, wherein the two independent sinusoidal waveforms have a frequency ratio that remains constant while sweeping between their respective start and end values.

18. The method of claim 13, further including selectably applying the force excitation symmetrically or antisymmetrically with respect to the test structure.

19. The method of claim 13, wherein the force excitation is applied via a single excitation source comprising the two independent sinusoidal waveforms.

20. The method of claim 13, wherein the force excitation is applied via two excitation sources, each corresponding to a respective one of the two independent sinusoidal waveforms.

17. A method of determining a frequency response function of a test structure, comprising:

applying force excitation to the test structure, the force excitation including two independent sinusoidal waveforms provided simultaneously;

continuously modifying the two independent sinusoidal waveforms while sensing a dynamic response of the test structure; and

determining the frequency response function based on the dynamic response of the test structure;

wherein continuously modifying the two independent sinusoidal waveforms includes sweeping the two independent sinusoidal waveforms between respective start and end frequency values such that the two independent sinusoidal waveforms remain independent; and

wherein each of the two independent sinusoidal waveforms has a frequency range during the sweeping, and wherein the start frequency of at least one of the two independent sinusoidal waveforms lies substantially at the midpoint of its respective range.