Synchronized reconfiguration of measurement modules

• US 8,290,725 B2
• Filed: 02/25/2010
• Issued: 10/16/2012
• Est. Priority Date: 11/18/2009
• Status: Active Grant

• Current Assignee: National Instruments Corporation (Emerson Electric Company)
• Original Assignee: National Instruments Corporation (Emerson Electric Company)
• Inventors: Suskic, Sead
• Primary Examiner(s): Nghiem, Michael
• Assistant Examiner(s): Ngon, Ricky
• Application Number:
  US12/713,007
• Publication Number:
  US 20110119000A1
• Time in Patent Office: 964 Days
• Field of Search: 702/58, 702/57, 702/85, 702/117, 702/119, 702/120, 702/127, 324/750.3, 324/750.01, 324/750.02, 324/750.14
• US Class Current: 702/58
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736

Abstract

Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF measurement configurations may be stored in a computer memory. The list of RF measurement configurations comprises a plurality of parameters for configuring operation of the at least one instrument. Information regarding the list of RF measurement configurations (e.g., a data stream) may be provided to the at least one RF instrument. The at least one RF instrument may perform the plurality of tests on the DUT, including the at least one RF instrument configuring itself according to the RF measurement configurations based on processing of the information. Configuring enables the at least one RF instrument to perform the plurality of tests on the DUT in a deterministic manner.

Claims

1. A method for configuring a plurality of devices according to a plurality of measurement configurations for performing a plurality of tests on a device under test (DUT), the method comprising:

creating a list of measurement configurations in a computer memory, wherein the list of measurement configurations comprises a plurality of parameters for configuring operation of the plurality of devices to perform the plurality of tests, wherein the list of measurement configurations further comprises synchronization instructions for enabling the plurality of devices to synchronize configuration changes for each measurement configuration in the list of measurement configurations;

providing information regarding the list of measurement configurations to the plurality of devices, wherein the information is usable by the plurality of devices to perform the plurality of tests on the DUT, wherein said performing the plurality of tests on the DUT comprises each of the plurality of devices configuring itself according to the list of measurement configurations and the synchronization instructions based on the information, wherein said configuring enables the plurality of devices to perform the plurality of tests on the DUT in a deterministic and synchronized manner.

2. The method of claim 1, further comprising:

the plurality of devices performing the plurality of tests on the DUT.

3. The method of claim 2, wherein each of the plurality of devices configuring itself according to the measurement configurations comprises each of the plurality of devices executing deterministic software processes that processes the information for reconfiguration.

4. The method of claim 1, wherein the plurality of devices comprises a signal measurement device and a signal generating device.

5. The method of claim 1, wherein the plurality of devices comprises radio frequency (RF) devices, and wherein the plurality of measurement configurations are RF measurement configurations.

6. The method of claim 1,

wherein the plurality of devices comprises a plurality of measurement modules housed in a chassis;

wherein the plurality of measurement modules are electrically coupled by an instrumentation bus.

7. The method of claim 1, further comprising:

creating an intermediate representation of the list of measurement configurations; and

generating the information based on the intermediate representation.

8. The method of claim 1, wherein said providing the information comprises providing a data stream to the plurality of devices.

9. The method of claim 1,

wherein the list of measurement configurations further comprises a specification for reconfiguring the plurality of devices from a first item in the list of measurement configurations to a second item in the list of measurement configurations.

10. The method of claim 1, wherein said providing is performed using direct memory access (DMA).

11. A non-transitory computer accessible memory medium storing program instructions for configuring a plurality of devices according to a plurality of measurement configurations for performing a plurality of tests on a device under test (DUT), wherein the program instructions are executable to:

create a list of measurement configurations in a computer memory, wherein the list of measurement configurations comprises a plurality of parameters for configuring operation of the plurality of devices to perform the plurality of tests, wherein the list of measurement configurations further comprises synchronization instructions for enabling the plurality of devices to synchronize configuration changes for each measurement configuration in the list of measurement configurations;

provide information regarding the list of measurement configurations to the plurality of devices, wherein the information is usable by the plurality of devices to perform the plurality of tests on the DUT, wherein said performing the plurality of tests on the DUT comprises each of the plurality of devices configuring itself according to the list of measurement configurations and the synchronization instructions based on the information, wherein said configuring enables the plurality of devices to perform the plurality of tests on the DUT in a deterministic and synchronized manner.

12. A non-transitory computer accessible memory medium of claim 11, wherein the plurality of devices are configured to configure themselves according to the measurement configurations comprises the plurality of devices executing deterministic software processes that processes the information for reconfiguration.

13. A non-transitory computer accessible memory medium of claim 11, wherein the plurality of devices comprises a signal measurement device and a signal generating device.

14. A non-transitory computer accessible memory medium of claim 11, wherein the plurality of devices comprises radio frequency (RF) devices, and wherein the plurality of measurement configurations are RF measurement configurations.

15. A non-transitory computer accessible memory medium of claim 11,

wherein the plurality of devices comprises a plurality of measurement modules housed in a chassis;

wherein the plurality of measurement modules are electrically coupled by an instrumentation bus.

16. A non-transitory computer accessible memory medium of claim 11, wherein the program instructions are further executable to:

create an intermediate representation of the list of measurement configurations; and

generate the information based on the intermediate representation.

17. A non-transitory computer accessible memory medium of claim 11, wherein said providing the information comprises providing a data stream to the plurality of devices.

18. A non-transitory computer accessible memory medium of claim 11,

wherein the list of measurement configurations further comprises a specification for reconfiguring the plurality of devices from a first item in the list of measurement configurations to a second item in the list of measurement configurations.

19. A non-transitory computer accessible memory medium of claim 11, wherein said providing is performed using direct memory access (DMA).

20. A system for configuring a plurality of devices according to a plurality of measurement configurations in order to perform a plurality of tests on a device under test (DUT), comprising:

a processor; and

a memory medium coupled to the processor, wherein the memory medium stores program instructions executable by the processor to;

create a list of measurement configurations in a computer memory, wherein the list of measurement configurations comprises a plurality of parameters for configuring operation of the plurality of devices to perform the plurality of tests, wherein the list of measurement configurations further comprises synchronization instructions for enabling the plurality of devices to synchronize configuration changes for each measurement configuration in the list of measurement configuration;

provide information regarding the list of measurement configurations to the plurality of devices, wherein the information is usable by the plurality of devices to perform the plurality of tests on the DUT, wherein said performing the plurality of tests on the DUT comprises each of the plurality of devices configuring itself according to the list of measurement configurations and the synchronization instructions based on the information, wherein said configuring enables the plurality of devices to perform the plurality of tests on the DUT in a deterministic and synchronized manner.