System for testing a power supply unit
First Claim
1. A system for testing a power supply unit comprising:
- a test sub-system for performing test and recording test results; and
a test control sub-system connected to the test sub-system and the power supply unit, the test control sub-system capable of selecting test items to test the power supply unit and setting an execution sequence of the test items;
wherein the test items comprises a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state;
the test control sub-system is capable of automatically switching the standby test item to the normal test item after a first predetermined time period for executing the standby test item, and switching the normal test item to the over temperature protection test item after a second predetermined time period for executing the normal test item;
wherein the test control sub-system comprises a fan switch circuit for switching on or off a fan of the power supply unit thereby enabling the power supply unit at the over heated state during executing the over temperature protection test item;
the test control sub-system further comprises a microcontroller unit connected to the test sub-system and the power supply unit, and a Power supply unit On (PSON) signal switch circuit connected to the microcontroller unit, the PSON signal switch circuit is controlled by the microcontroller unit and configured to switch a PSON signal on the power supply unit between a low level and a high level.
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Accused Products
Abstract
A system for testing a power supply unit includes a test sub-system and a test control sub-system connected to the test sub-system and the power supply unit. The test sub-system perform tests and record the results. The test control sub-system is capable of selecting test items to test the power supply unit and setting an execution sequence of the test items. The test items includes a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state. The test control sub-system is further capable of automatically switching the standby test item to the normal test item, and switching the normal test item to the over temperature protection test item.
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Citations
17 Claims
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1. A system for testing a power supply unit comprising:
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a test sub-system for performing test and recording test results; and a test control sub-system connected to the test sub-system and the power supply unit, the test control sub-system capable of selecting test items to test the power supply unit and setting an execution sequence of the test items; wherein the test items comprises a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state;
the test control sub-system is capable of automatically switching the standby test item to the normal test item after a first predetermined time period for executing the standby test item, and switching the normal test item to the over temperature protection test item after a second predetermined time period for executing the normal test item;
wherein the test control sub-system comprises a fan switch circuit for switching on or off a fan of the power supply unit thereby enabling the power supply unit at the over heated state during executing the over temperature protection test item;
the test control sub-system further comprises a microcontroller unit connected to the test sub-system and the power supply unit, and a Power supply unit On (PSON) signal switch circuit connected to the microcontroller unit, the PSON signal switch circuit is controlled by the microcontroller unit and configured to switch a PSON signal on the power supply unit between a low level and a high level. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A system for testing a power supply unit comprising:
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a test sub-system connected to the power supply unit; and a test control sub-system coupled to the test sub-system and the power supply unit, the test control sub-system comprising a microcontroller unit capable of automatically switching On/Off an AC source applied to the power supply unit, switching On/Off a Power supply unit On (PSON) signal fed to the power supply unit, and switching On/Off a fan of the power supply unit for providing a normal and an overheated environment to the power supply unit. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17)
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Specification