Light emitting device with high outcoupling

• US 8,310,150 B2
• Filed: 02/04/2009
• Issued: 11/13/2012
• Est. Priority Date: 02/04/2009
• Status: Active Grant

• Current Assignee: Board of Regents of the University of Michigan (University of Michigan)
• Original Assignee: Board of Regents of the University of Michigan (University of Michigan)
• Inventors: Forrest, Stephen R., Giebink, Noel
• Primary Examiner(s): Roy, Sikha
• Application Number:
  US12/365,349
• Publication Number:
  US 20100194267A1
• Time in Patent Office: 1,378 Days
• Field of Search: 313504-506
• US Class Current: 313/506
• CPC Class Codes: H10K 50/80 Constructional details
• CPC Class Codes: H10K 50/81 Anodes
• CPC Class Codes: H10K 50/814 combined with auxiliary electrodes, e.g. ITO layer combined with metal lines
• CPC Class Codes: H10K 50/85 Arrangements for extracting light from the devices
• CPC Class Codes: H10K 50/858 comprising refractive means, e.g. lenses

Abstract

Organic light emitting devices having a low-index electrode and a substrate with a surface treatment are provided. The combination of a relatively low-index electrode and a surface-treated substrate may eliminate guided modes and increase the light outcoupled by the device. It has been found that the combination surprisingly provides up to 1.5 times more outcoupled light than would be expected based on the performance of similar devices having higher-index electrodes.

Claims

1. A device comprising:

a substrate comprising an outcoupling surface treatment;

a first electrode disposed over the substrate, the first electrode comprising a first electrode material;

an emissive stack disposed over the first electrode, the emissive stack comprising at least one emissive material; and

a second electrode disposed over the emissive stack;

wherein the first electrode material has a lower index of refraction than the substrate.

2. The device of claim 1, wherein the emissive stack comprises at least one organic emissive material.

3. The device of claim 2, wherein the first electrode material has a lower index of refraction than at least one emissive material in the emissive stack.

4. The device of claim 2, wherein the first electrode material has a lower index of refraction than each organic material in the emissive stack.

5. The device of claim 2, wherein the index of refraction of the first electrode material is lower than the index of refraction of the substrate.

6. The device of claim 2, wherein the first electrode further comprises a metallic grid.

7. The device of claim 2, wherein the outcoupling surface treatment comprises a microlens sheet disposed below the substrate, with a convex side of the microlens sheet facing away from the substrate.

8. The device of claim 2, wherein the outcoupling surface treatment comprises a roughened surface treatment on the outer surface of the substrate.

9. The device of claim 2, wherein the index of refraction of the first electrode material is in the range 0.5-1.7.

10. The device of claim 2, wherein the index of refraction of the first electrode material is in the range 1.3-1.5.

11. The device of claim 9, wherein the index of refraction of the first electrode material is in the range 1.3-1.5.

12. The device of claim 2, wherein the first electrode comprises a polymer.

13. The device of claim 2, wherein the first electrode comprises PEDOT.

14. The device of claim 2, wherein the first electrode material is a polymer, and the first electrode further comprises a metallic grid.

15. The device of claim 2, wherein each material in the emissive stack has an index of refraction in the range 1.55-1.75.

16. The device of claim 15, wherein the index of refraction of the substrate is in the range 1.45-1.55.

17. The device of claim 15, wherein the index of refraction of the first electrode material is in the range 1.3-1.5.

18. The device of claim 10, wherein the index of refraction of the substrate is in the range 1.45-1.55.

19. The device of claim 15, wherein the index of refraction of the first electrode material is in the range 0.5-1.7.

20. The device of claim 9, wherein the index of refraction of the substrate is in the range 1.45-1.55.

21. The device of claim 2, wherein more than 30% of the total light generated within the device is emitted.

22. The device of claim 2, wherein at least 35% of the total light generated within the device is emitted.

23. A device comprising:

a substrate comprising an outcoupling surface treatment;

a first electrode disposed over the substrate, the first electrode comprising a first electrode material;

an emissive stack disposed over the first electrode, the emissive stack comprising at least one emissive material; and

a second electrode disposed over the emissive stack;

wherein the first electrode material has a lower index of refraction than at least one emissive material in the emissive stack wherein the outcoupling surface treatment is on a surface of the substrate that is opposite the first electrode.