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Methods, devices, and systems for detecting properties of target samples

  • US 8,312,759 B2
  • Filed: 02/14/2011
  • Issued: 11/20/2012
  • Est. Priority Date: 02/17/2009
  • Status: Expired due to Fees
First Claim
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1. A method for detecting the presence and/or properties of a target sample, the method comprising:

  • selectively collecting a microscopic portion of a target sample with a sample collector;

    detecting, with the sample collector, at least one of the following—

    a presence of the microscopic portion of the target sample in the sample collector; and

    one or more properties of the microscopic portion of the target sample;

    reporting, from the sample collector, an indication of the detection of the one or more properties of the microscopic portion of the target sample; and

    at least partially removing the microscopic portion of the target sample from the sample collector wherein the sample collector is comprised of an architectural construct including spaced apart layers of matrix characterizations of a crystal.

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