Methods, devices, and systems for detecting properties of target samples
First Claim
1. A method for detecting the presence and/or properties of a target sample, the method comprising:
- selectively collecting a microscopic portion of a target sample with a sample collector;
detecting, with the sample collector, at least one of the following—
a presence of the microscopic portion of the target sample in the sample collector; and
one or more properties of the microscopic portion of the target sample;
reporting, from the sample collector, an indication of the detection of the one or more properties of the microscopic portion of the target sample; and
at least partially removing the microscopic portion of the target sample from the sample collector wherein the sample collector is comprised of an architectural construct including spaced apart layers of matrix characterizations of a crystal.
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Accused Products
Abstract
Systems and methods for collecting portions of a target sample are disclosed herein. A method for detecting the presence and/or properties of a target sample can include selectively collecting a portion of a target sample with a sample collector and detecting, with the sample collector, the presence of one or more properties of the microscopic portion of the target sample. The method also includes analyzing, with the sample collector, the one or more properties of the microscopic portion of the target sample. Based on the analysis, the method further includes reporting, from the sample collector, a real-time indication of the analysis of the one or more properties of the target sample. The method can also include at least partially removing the microscopic portion of the target sample from the sample collector. The methods and systems disclosed herein can be used, for example, in systems or environments directed to quality assurance, preventative maintenance, safety, hazard warnings, homeland security, chemical identification and surveillance, and/or other suitable environments.
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Citations
18 Claims
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1. A method for detecting the presence and/or properties of a target sample, the method comprising:
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selectively collecting a microscopic portion of a target sample with a sample collector; detecting, with the sample collector, at least one of the following— a presence of the microscopic portion of the target sample in the sample collector; and one or more properties of the microscopic portion of the target sample; reporting, from the sample collector, an indication of the detection of the one or more properties of the microscopic portion of the target sample; and at least partially removing the microscopic portion of the target sample from the sample collector wherein the sample collector is comprised of an architectural construct including spaced apart layers of matrix characterizations of a crystal. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method comprising:
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collecting a microscopic portion of a target sample with a self-contained sensing component wherein the means for selectively collecting the portion of the target sample comprises an architectural construct including spaced apart layers of matrix characterization of a crystal that are configured to load individual portions of the target sample; automatically sensing at least one property of the collected microscopic portion of the target sample with the sensing component; and providing a real-time externally accessible indication of the at least one property from the sensing component. - View Dependent Claims (9, 10, 11, 12, 13)
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14. A system comprising:
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means for selectively collecting a portion of a target sample, wherein the portion is a microscopic portion relative to a size of the target sample wherein the means for selectively collecting the portion of the target sample comprises an architectural construct including spaced apart layers of matrix characterization of a crystal that are configured to load individual portions of the target sample; means for automatically detecting the presence of one or more properties of the collected portion of the target sample; means for automatically analyzing the one or more properties of the microscopic portion of the target sample; and means for reporting an instantaneous indication of the analysis of the one or more properties of the target sample. - View Dependent Claims (15, 16, 17, 18)
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Specification